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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
臺大學術典藏 |
2020-06-29T01:20:10Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV.
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Shih, Chi-Jih;Hsieh, Shih-An;Lu, Yi-Chang;Li, James Chien-Mo;Wu, Tzong-Lin;Chakrabarty, Krishnendu; Shih, Chi-Jih; Hsieh, Shih-An; Lu, Yi-Chang; Li, James Chien-Mo; Wu, Tzong-Lin; Chakrabarty, Krishnendu; CHIEN-MO LI |
淡江大學 |
2012-10-18 |
Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC
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Shih, Chi-Jih; Hsu, Chih-Yao; Kuo, Chun-Yi; Li, James; Rau, Jiann-Chyi; Krishnendu Chakrabarty |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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