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Showing items 1-22 of 22  (1 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:48:43Z Interfacial reactions of Pd/Si0.76Ge0.24 by pulsed KrF laser annealing Chen, DR; Luo, JS; Lin, WT; Chang, CY; Shih, PS
國立交通大學 2014-12-08T15:46:32Z Room temperature oxidation of Cu/Si0.76Ge0.24 annealed at 200 to 300 degrees C Luo, JS; Lin, WT; Chang, CY; Shih, PS
國立交通大學 2014-12-08T15:46:22Z Characterization of Si1-x-yGexCy films grown by C+ implantation and subsequent pulsed laser annealing Luo, JS; Lin, WT; Chang, CY; Shih, PS; Pan, FM; Chang, TC
國立交通大學 2014-12-08T15:46:21Z Interfacial reactions of Co/Si0.76Ge0.24 and Co(Si0.76Ge0.24)/Si0.76Ge0.24 by pulsed KrF laser annealing Luo, JS; Hang, YL; Lin, WT; Chang, CY; Shih, PS
國立交通大學 2014-12-08T15:46:20Z A novel lightly doped drain polysilicon thin-film transistor with oxide sidewall spacer formed by one-step selective liquid phase deposition Shih, PS; Chang, CY; Chang, TC; Huang, TY; Peng, DZ; Yeh, CF
國立交通大學 2014-12-08T15:46:02Z Effects of Mo-free C40Ti(Si1-xGex)(2) precursors and the thickness of an interposed Mo layer on the enhanced formation of C54Ti(Si1-xGex)(2) Luo, JS; Huang, JC; Lin, WT; Chang, CY; Shih, PS
國立交通大學 2014-12-08T15:45:53Z Annealing effects on the interfacial reactions of Ni on Si0.76Ge0.24 and Si1-x-yGexCy Luo, JS; Lin, WT; Chang, CY; Shih, PS; Pan, FM
國立交通大學 2014-12-08T15:45:46Z The effects of microcrystalline silicon film structure on low-high-low band-gap thin film transistor Chang, CY; Lee, YS; Huang, TY; Shih, PS; Lin, CW
國立交通大學 2014-12-08T15:45:19Z Improvements of amorphous-silicon inverted-staggered thin-film transistors using high-temperature-deposited Al gate with chemical mechanical polishing Shih, PS; Chang, TC; Liang, CY; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:45:14Z Interfacial reactions of Ni/Si0.76Ge0.24 and Ni/Si1-x-yGexCy by vacuum annealing and pulsed KrF laser annealing Luo, JS; Lin, WT; Chang, CY; Shih, PS
國立交通大學 2014-12-08T15:45:14Z Pulsed KrF laser annealing of Mo/Si0.76Ge0.24 Luo, JS; Lin, WT; Chang, CY; Shih, PS; Chang, TC
國立交通大學 2014-12-08T15:45:10Z Dimensional effects on the drain current of n- and p-channel polycrystalline silicon thin film transistors Shih, PS; Zan, HW; Chang, TC; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:44:56Z Dimensional effects on the reliability of polycrystalline silicon thin-film transistors Zan, HW; Shih, PS; Chang, TC; Chang, CY
國立交通大學 2014-12-08T15:44:47Z Characterization and reliability of lightly-doped-drain polysilicon thin-film transistors with oxide sidewall spacer formed by one-step selective liquid phase deposition Shih, PS; Chang, TC; Huang, TY; Yeh, CF; Chang, CY
國立交通大學 2014-12-08T15:44:46Z Effects of an interposed Mo layer on the interfacial reactions of Ti/Si0.76Ge0.24 by rapid thermal annealing and pulsed laser annealing Huang, JC; Luo, JS; Lin, WT; Chang, CY; Shih, PS
國立交通大學 2014-12-08T15:41:56Z A W-spacer GOLD TFT with high performance and high reliability Zan, HW; Peng, DZ; Shih, PS; Chang, TC; Liu, PT; Chang, CY
國立交通大學 2014-12-08T15:41:56Z Comparison of poly-Si films deposited by UHVCVD and LPCVD and its application for thin film transistors Peng, DZ; Zan, HW; Shih, PS; Chang, TC; Lin, CW; Chang, CY
國立交通大學 2014-12-08T15:41:38Z Polycrystalline silicon thin-film transistor with self-aligned SiGe raised source/drain Peng, DZ; Chang, TC; Shih, PS; Zan, HW; Huang, TY; Chang, CY; Liu, PT
國立交通大學 2014-12-08T15:41:27Z Analysis of narrow width effects in polycrystalline silicon thin film transistors Zan, HW; Chang, TC; Shih, PS; Peng, DZ; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:40:35Z A study of parasitic resistance effects in thin-channel polycrystalline silicon TFTs with tungsten-clad source/drain Zan, HW; Chang, TC; Shih, PS; Peng, DZ; Kuo, PY; Huang, TY; Chang, CY; Liu, PT
國立交通大學 2014-12-08T15:39:55Z Short-channel poly-Si thin-film transistors with ultrathin channel and self-aligned tungsten-clad source/drain Zan, HW; Chang, TC; Shih, PS; Peng, DZ; Kuo, PY; Huang, TY; Chang, CY; Liu, PT
國立交通大學 2014-12-08T15:27:13Z High performance thin-film transistors with low-high-low band gap engineering Chang, CY; Lee, YS; Shih, PS; Lin, CW

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