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Showing items 11-20 of 22  (3 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:45:14Z Pulsed KrF laser annealing of Mo/Si0.76Ge0.24 Luo, JS; Lin, WT; Chang, CY; Shih, PS; Chang, TC
國立交通大學 2014-12-08T15:45:10Z Dimensional effects on the drain current of n- and p-channel polycrystalline silicon thin film transistors Shih, PS; Zan, HW; Chang, TC; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:44:56Z Dimensional effects on the reliability of polycrystalline silicon thin-film transistors Zan, HW; Shih, PS; Chang, TC; Chang, CY
國立交通大學 2014-12-08T15:44:47Z Characterization and reliability of lightly-doped-drain polysilicon thin-film transistors with oxide sidewall spacer formed by one-step selective liquid phase deposition Shih, PS; Chang, TC; Huang, TY; Yeh, CF; Chang, CY
國立交通大學 2014-12-08T15:44:46Z Effects of an interposed Mo layer on the interfacial reactions of Ti/Si0.76Ge0.24 by rapid thermal annealing and pulsed laser annealing Huang, JC; Luo, JS; Lin, WT; Chang, CY; Shih, PS
國立交通大學 2014-12-08T15:41:56Z A W-spacer GOLD TFT with high performance and high reliability Zan, HW; Peng, DZ; Shih, PS; Chang, TC; Liu, PT; Chang, CY
國立交通大學 2014-12-08T15:41:56Z Comparison of poly-Si films deposited by UHVCVD and LPCVD and its application for thin film transistors Peng, DZ; Zan, HW; Shih, PS; Chang, TC; Lin, CW; Chang, CY
國立交通大學 2014-12-08T15:41:38Z Polycrystalline silicon thin-film transistor with self-aligned SiGe raised source/drain Peng, DZ; Chang, TC; Shih, PS; Zan, HW; Huang, TY; Chang, CY; Liu, PT
國立交通大學 2014-12-08T15:41:27Z Analysis of narrow width effects in polycrystalline silicon thin film transistors Zan, HW; Chang, TC; Shih, PS; Peng, DZ; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:40:35Z A study of parasitic resistance effects in thin-channel polycrystalline silicon TFTs with tungsten-clad source/drain Zan, HW; Chang, TC; Shih, PS; Peng, DZ; Kuo, PY; Huang, TY; Chang, CY; Liu, PT

Showing items 11-20 of 22  (3 Page(s) Totally)
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