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机构 日期 题名 作者
國立交通大學 2018-08-21T05:56:34Z Modeling the Variability Caused by Random Grain Boundary and Trap-location Induced Asymmetrical Read Behavior for a Tight-pitch Vertical Gate 3D NAND Flash Memory Using Double-Gate Thin-Film Transistor (TFT) Device Hsiao, Yi-Hsuan; Lue, Hang-Ting; Chen, Wei-Chen; Chen, Chih-Ping; Chang, Kuo-Ping; Shih, Yen-Hao; Tsui, Bing-Yue; Lu, Chih-Yuan
國立交通大學 2017-04-21T06:49:17Z A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (DT) BE-SONOS Performance Lo, Roger; Du, Pei-Ying; Hsu, Tzu-Hsuan; Wu, Chen-Jun; Guo, Jung-Yi; Cheng, Chun-Min; Lue, Hang-Ting; Shih, Yen-Hao; Hou, Tuo-Hung; Hsieh, Kuang-Yeu; Lu, Chih-Yuan
朝陽科技大學 2017-02-28 設計並實現SPEEX語音壓縮技術於ARM處理器上 施彥豪; Shih, Yen-Hao
國立交通大學 2014-12-08T15:36:19Z Modeling the Impact of Random Grain Boundary Traps on the Electrical Behavior of Vertical Gate 3-D NAND Flash Memory Devices Hsiao, Yi-Hsuan; Lue, Hang-Ting; Chen, Wei-Chen; Chang, Kuo-Pin; Shih, Yen-Hao; Tsui, Bing-Yue; Hsieh, Kuang-Yeu; Lu, Chih-Yuan
國立交通大學 2014-12-08T15:07:41Z Tungsten Oxide Resistive Memory Using Rapid Thermal Oxidation of Tungsten Plugs Lai, Erh-Kun; Chien, Wei-Chih; Chen, Yi-Chou; Hong, Tian-Jue; Lin, Yu-Yu; Chang, Kuo-Pin; Yao, Yeong-Der; Lin, Pang; Horng, Sheng-Fu; Gong, Jeng; Tsai, Shih-Chang; Lee, Ching-Hsiung; Hsieh, Sheng-Hui; Chen, Chun-Fu; Shih, Yen-Hao; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan
國立臺灣大學 2007 Modeling and Characterization of Hydrogen Induced Charge Loss in Nitride Trapping Memory Yang, Yi-Lin; Chang, Chia-Hua; Shih, Yen-Hao; Hsieh, Kuang-Yeu; Hwu, Jenn-Gwo
國立臺灣大學 2004 High Sensitive and Wide Detecting Range MOS Tunneling Temperature Sensors for On-Chip Temperature Detection Shih, Yen-Hao; Lin, Shian-Ru; Wang, Tsung-Miau; Hwu, Jenn-Gwo
國立臺灣大學 2002 Ultralow leakage characteristics of ultrathin gate oxides (~3 nm) prepared by anodization followed by high-temperature annealing Ting, Chieh-Chih; Shih, Yen-Hao; Hwu, Jenn-Gwo
國立臺灣大學 2001 An on-Chip Temperature Sensor by Utilizing a MOS Tunneling Diode Shih, Yen-Hao; Hwu, Jenn-Gwo
國立臺灣大學 1999 Improvement in the electrical properties of thin gate oxides bychemical-assisted electron stressing followed by annealing (CAESA) Shih, Yen-Hao; Hwu, Jenn-Gwo

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