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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:41:14Z An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:40:48Z Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:40:33Z An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003) Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:40:12Z Lower confidence bounds with sample size information for C-pm applied to production yield assurance Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:39:50Z Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process Pearn, WL; Shu, MH
國立交通大學 2014-12-08T15:39:16Z C-pm MPPAC for manufacturing quality control applied to precision voltage reference process Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:38:57Z Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:38:52Z C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:18:52Z Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:17:59Z Testing process capability based on C-pm in the presence of random measurement errors Pearn, WL; Shu, MH; Hsu, BM

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