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Showing items 1-10 of 10 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2014-12-08T15:41:14Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
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Pearn, WL; Shu, MH |
國立交通大學 |
2014-12-08T15:40:48Z |
Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC
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Pearn, WL; Shu, MH |
國立交通大學 |
2014-12-08T15:40:33Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
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Pearn, WL; Shu, MH |
國立交通大學 |
2014-12-08T15:40:12Z |
Lower confidence bounds with sample size information for C-pm applied to production yield assurance
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Pearn, WL; Shu, MH |
國立交通大學 |
2014-12-08T15:39:50Z |
Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
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Pearn, WL; Shu, MH |
國立交通大學 |
2014-12-08T15:39:16Z |
C-pm MPPAC for manufacturing quality control applied to precision voltage reference process
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Pearn, WL; Shu, MH; Hsu, BM |
國立交通大學 |
2014-12-08T15:38:57Z |
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
|
Pearn, WL; Shu, MH; Hsu, BM |
國立交通大學 |
2014-12-08T15:38:52Z |
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
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Pearn, WL; Shu, MH; Hsu, BM |
國立交通大學 |
2014-12-08T15:18:52Z |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
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Pearn, WL; Shu, MH; Hsu, BM |
國立交通大學 |
2014-12-08T15:17:59Z |
Testing process capability based on C-pm in the presence of random measurement errors
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Pearn, WL; Shu, MH; Hsu, BM |
Showing items 1-10 of 10 (1 Page(s) Totally) 1 View [10|25|50] records per page
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