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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 191-198 of 198  (8 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:07:17Z Investigation and Analysis of Mismatching Properties for Nanoscale Strained MOSFETs Kuo, Jack Jyun-Yan; Chen, William Po-Nien; Su, Pin
國立交通大學 2014-12-08T15:07:04Z Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Liao, Kuo-Hsiang; Chen, Bo-Yuan; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei
國立交通大學 2014-12-08T15:06:58Z Impact of Process-Induced Uniaxial Strain on the Temperature Dependence of Carrier Mobility in Nanoscale pMOSFETs Chen, William P. N.; Kuo, Jack J. Y.; Su, Pin
國立交通大學 2014-12-08T15:06:58Z Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETs Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin
國立交通大學 2014-12-08T15:06:44Z Investigation of Cell Stability and Write Ability of FinFET Subthreshold SRAM Using Analytical SNM Model Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:06:23Z Investigation of inversion capacitance-voltage reconstruction for metal oxide semiconductor field effect transistors with leaky dielectrics using BSIM4/SPICE and intrinsic input resistance model Lee, Wei; Su, Pin; Su, Ke-Wei; Chiang, Chung-Shi; Liu, Sally
國立交通大學 2014-12-08T15:04:22Z Investigation of Channel Backscattering Characteristics for Nanoscale SOI MOSFETs Using a New Temperature-Dependent Method Lee, Wei; Su, Pin
國立交通大學 2014-12-08T15:01:50Z Investigation of Electrostatic Integrity for Ultra-Thin-Body GeOI MOSFET Using Analytical Solution of Poisson's Equation Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin

Showing items 191-198 of 198  (8 Page(s) Totally)
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