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Showing items 6-15 of 238 (24 Page(s) Totally)
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| 國立交通大學 |
2020-07-01T05:21:16Z |
Role of tungsten dopants in indium oxide thin-film transistor on radiation hardness technology
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Ruan, Dun-Bao; Liu, Po-Tsun; Gan, Kai-Jhih; Chiu, Yu-Chuan; Hsu, Chih-Chieh; Sze, Simon M. |
| 國立交通大學 |
2020-05-05T00:02:22Z |
In-Memory Digital Comparator Based on a Single Multivalued One-Transistor-One-Resistor Memristor
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Sze, Simon M.; Miao, Xiangshui; Chang, Ting-Chang; Cheng, Long; Zheng, Hao-Xuan; Li, Yi |
| 國立交通大學 |
2020-03-02T03:23:32Z |
Abnormal High Resistive State Current Mechanism Transformation in Ti/HfO2/TiN Resistive Random Access Memory
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Zhou, Kuan-Ju; Chang, Ting-Chang; Lin, Chih-Yang; Chen, Chun-Kuei; Tseng, Yi-Ting; Zheng, Hao-Xuan; Chen, Hong-Chih; Sun, Li-Chuan; Lien, Chih-Ying; Tan, Yung-Fang; Wu, Chung-Wei; Yeh, Yu-Hsuan; Sze, Simon M. |
| 國立交通大學 |
2020-03-01 |
High-Precision Symmetric Weight Update of Memristor by Gate Voltage Ramping Method for Convolutional Neural Network Accelerator
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Miao, Xiang-Shui; Sze, Simon M.; Chang, Ting-Chang; Zheng, Hao-Xuan; Kuang, Rui; He, Yu-Hui; Lin, Chih-Yang; Duan, Nian; Feng, Gui-Rong; Pan, Wen-Qian; Li, Yi; Chen, Jia |
| 國立交通大學 |
2020-03-01 |
Improvement of Resistive Switching Characteristics in Zinc Oxide-Based Resistive Random Access Memory by Ammoniation Annealing
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Sze, Simon M.; Tsai, Tsung-Ming; Huang, Hui-Chun; Ma, Xiao-Hua; Hao, Yue; Tan, Yung-Fang; Chen, Wen-Chung; Tai, Mao-Chou; Yang, Chih-Cheng; Chen, Wei-Jang; Chang, Ting-Chang; Wu, Pei-Yu; Zheng, Hao-Xuan; Shih, Chih-Cheng |
| 國立交通大學 |
2020-02-02T23:54:28Z |
A characteristic improved technique and analysis with plasma treatment to the electrode on oxide-based resistive random access memory
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Lin, Chih-Yang; Chang, Ting-Chang; Pan, Chih-Hung; Chen, Min-Chen; Xu, You-Lin; Tan, Yung-Fang; Wu, Pei-Yu; Chen, Chun-Kuei; Huang, Wei-Chen; Lin, Yun-Hsuan; Chao, Yu-Ting; Shou, Cheng-Yun; Ma, Xiao-Hua; Hao, Yue; Sze, Simon M. |
| 國立交通大學 |
2019-12-13T01:12:22Z |
Overcoming Limited Resistance in 1T1R RRAM Caused by Pinch-Off Voltage During Reset Process
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Zheng, Hao-Xuan; Chen, Min-Chen; Chang, Ting-Chang; Su, Yu-Ting; Chen, Wen-Chung; Huang, Wei-Chen; Wu, Pei-Yu; Tan, Yung-Fang; Xu, You-Lin; Zhang, Yong-Ci; Ma, Xiao-Hua; Hao, Yue; Sze, Simon M. |
| 國立交通大學 |
2019-12-13T01:12:21Z |
Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment
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Chen, Hong-Chih; Kuo, Chuan-Wei; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Po-Hsun; Chen, Guan-Fu; Huang, Shin-Ping; Chen, Jian-Jie; Zhou, Kuan-Ju; Shih, Chih-Cheng; Tsao, Yu-Ching; Huang, Hui-Chun; Sze, Simon M. |
| 國立交通大學 |
2019-12-13T01:12:20Z |
Investigation of the forming process under UV illumination in HfO2-based resistance random access memory with a transparent electrode
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Huang, Wei-Chen; Huang, Shin-Ping; Chen, Po-Hsun; Chen, Min-Chen; Chang, Ting-Chang; Shih, Chih-Cheng; Tseng, Yi-Ting; Zheng, Hao-Xuan; Tan, Yung-Fang; Wu, Chung-Wei; Yeh, Yuh-Suan; Ma, Xiao-Hua; Hao, Yue; Sze, Simon M. |
| 國立交通大學 |
2019-12-13T01:10:04Z |
Investigation of resistive switching in copper/InGaZnO/Al2O3-based memristor
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Gan, Kai-Jhih; Chang, Wei-Chiao; Liu, Po-Tsun; Sze, Simon M. |
Showing items 6-15 of 238 (24 Page(s) Totally)
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