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| 國立成功大學 |
2021 |
On the Optimization of Performance and Reliability in a-InGaZnO Thin-Film Transistors by Versatile Light Shielding Design
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Kuo, C.-W.;Chang, T.-C.;Chien, Y.-C.;Tsai, Y.-L.;Tu, H.-Y.;Tsao, Y.-C.;Chien, Y.-T.;Chen, H.-C.;Chen, J.-J.;Tsai, Tsai T.-M.;Sze, Sze S.M. |
| 國立成功大學 |
2020 |
Enhancing hot-carrier reliability of dual-gate low-Temperature polysilicon tfts by increasing lightly doped drain length
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Chen, J.-J.;Chang, T.-C.;Chen, H.-C.;Zhou, K.-J.;Kuo, C.-W.;Wu, Wu W.-C.;Li, H.-C.;Tai, M.-C.;Tu, Y.-F.;Tsai, Y.-L.;Wu, P.-Y.;Sze, Sze S.M. |
| 國立成功大學 |
2020 |
Abnormal High Resistive State Current Mechanism Transformation in Ti/HfO2/TiN Resistive Random Access Memory
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Zhou, K.-J.;Tan, Y.-F.;Wu, C.-W.;Yeh, Yeh Y.-H.;Sze, Sze S.M.;Chang, T.-C.;Lin, C.-Y.;Chen, Chen C.-K.;Tseng, Y.-T.;Zheng, H.-X.;Chen, H.-C.;Sun, L.-C.;Lien, C.-Y. |
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