臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 81-90 of 180 (18 Page(s) Totally)
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Institution	Date	Title	Author
國立中山大學	2006	High-performance polycrystalline silicon thin-film transistors with oxide–nitride–oxide gate dielectric and multiple nanowire channels	S.C. Chen;T.C. Chang;P.T. Liu;Y.C. Wu;C.C. Tsai;T.S. Chang;Chen-Hsin Lien
國立中山大學	2005-10	Thermal Stress Effect on the Ferroelectric Characteristics of BaTiO3 Thin Films for Nonvolatile Memory Applications	K.H. Chen;Y.C. Chen;S.Y. Lin;C.M. Wang;T.C. Chang
國立中山大學	2005-10	Fabrication and Characteristics of Ba(Ti0.9,Zr0.1)O3 Thin Films on Glass Substrate	K.H. Chen;C.F. Yang;Y.C. Chen;T.C. Chang
國立中山大學	2005-04	Effects of Laser Annealing on the Electrical Characteristics of (Ba0.7,Sr0.3)(Ti0.9,Zr0.1)O3 Thin Films	K.H. Chen;K.S. Kao;C.C. Cheng;Y.C. Chen;T.C. Chang
中原大學	2005	Evaluation of wastewater reclamation processes in a high-tech industrial park	S.H. Chuang;T.C. Chang;S.J. You;C.F. Ouyang
國立中山大學	2005	Improvement of reliability for polycrystalline thin film transistor using self-aligned fluorinated silica glass spacers	C.H. Tu;T.C. Chang;P.T. Liu;H.W. Zan;Y.H. Tai;Y.C. Wu;C.Y. Chang
國立中山大學	2005	Effects of oxygen plasma ashing on barrier dielectric SiCN film	C.W. Chen;T.C. Chang;P.T. Liu;T.S. Tsai;T.Y. Tseng
國立中山大學	2005	Low power device with NiSi2 nanocrystals embedded in silicon dioxide layer	P.H. Yen;C.H. Yu;L.J. Chen;H.H. Wu;P.T. Liu;T.C. Chang
國立中山大學	2005	Damage effect of fluorine implantation on PECVD alpha-SiOC barrier dielectric	F.M. Yang;T.C. Chang;P.T. Liu;C.W. Chen;Y.H. Tai;J.C. Lou
國立中山大學	2005	An interfacial investigation of high dielectric constant material hafnium oxide on Si substrate	S.C. Chen;J.C. Lou;C.H. Chien;P.T. Liu;T.C. Chang

Showing items 81-90 of 180 (18 Page(s) Totally)
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