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Institution Date Title Author
國立臺灣海洋大學 2015-12 Typhoon Effect on Kuroshio and Green Island Wake: A Modelling Study T.-W. Hsu;M.-H. Chou; T.-H. Hou;S.-J. Liang
南台科技大學 2005 Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application C. W. Yang; Y. K. Fang; S. F. Chen; C. S. Lin; C. Y. Lin; W. D. Wang; T. H. Chou; P. J. Lin; M. F. Wang; T. H. Hou; L. G. Yao; S. C. Chen; M. S. Liang;陳世芳;陳順智
南台科技大學 2003 Effect of polycrystailline-silicon gate types on the opposite flatband voltage shift in n-type and p-type metal-oxide-semiconductor field-effect transistor for high-k-HfO2 dielectric C. W. Yang; Y. K. Fang; C. H. Chen; S. F. Chen; C. Y. Lin; C. S. Lin; M. F. Wang; Y. M. Lin; T. H. Hou; C. H. Chen; L. G. Yao; S. C. Chen; M. S. Liang;陳世芳
南台科技大學 2003 HfO2/HfSixOy high-k gate stack with very low leakage current for low-power poly-si gated CMOS application C. W. Yang; Y. K. Fang; S. F. Chen; M. F. Wang; T.H.Hou; Y.M.Lin; L.G.Yao; S. C. Chen; M. S. Liang;陳世芳

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