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Institution Date Title Author
元智大學 Mar-21 IMC microstructure modification and mechanical reinforcement of Sn-Ag-Cu/Cu microelectronic joints through an advanced surface finish technique Cheng-En Ho; S. P. Yang; P. T. Lee; C. Y. Lee; C. C. Chen; T. T. Kuo
元智大學 Aug-20 Influence of Pd(P) Thickness on the Pd-free Solder Reaction between Eutectic Sn-Ag alloy and Au/Pd(P)/Ni(P)/Cu Multilayer C. Y. Lee; S. P. Yang; C. H. Yang; M. K. Lu; T. T. Kuo; Cheng-En Ho
元智大學 2020/11/7 Morphological Transition of Cu6Sn5 and Cu3Sn Induced by Surface Finish and Its Mechanical Reliability of Solder Joints C. H. Li; C. Y. Lee; S. P. Yang; C. C. Chen; T. T. Kuo; Cheng-En Ho
元智大學 2020/10/21 Electromagnetic Properties of Ni(P) and Its Signal Transmission Performance in 5G Communication Applications W. L. Chou; H. W. Tseng; C. J. Yu; C. Y. Lee; Huei-Ru Fuh; T. T. Kuo; Chien-Chang Huang; Cheng-En Ho
元智大學 2020/10/21 Effects of Surface Finish on the Intermetallic Compound Formation and Mechanical Reliability of Microelectronic Solder Joints C. H. Li; S. P. Yang; C. Y. Lee; C. C. Chen; T. T. Kuo; Cheng-En Ho
元智大學 2020/10/21 Electromagnetic Properties of Ni(P) and Its Signal Transmission Performance in 5G Communication Applications W. L. Chou; H. W. Tseng; C. J. Yu; C. Y. Lee; Huei-Ru Fuh; T. T. Kuo; Chien-Chang Huang; Cheng-En Ho
元智大學 2013-02 Reliability Evaluation on a Submicron Ni(P) Thin Film for Lead-Free Soldering Cheng-En Ho; C. W. Fan; W. H. Wu; T. T. Kuo
元智大學 2012-12 Development and Evaluation of Direct Deposition of Au/Pd(P) Bilayers over Cu Pads in Soldering Applications Cheng-En Ho; T. T. Kuo; Wojciech Gierlotka; F. M. Ma
元智大學 2012-12 Development and Evaluation of Direct Deposition of Au/Pd(P) Bilayers over Cu Pads in Soldering Applications Cheng-En Ho; T. T. Kuo; Wojciech Gierlotka; F. M. Ma
元智大學 2012-10 Inhibiting the Growth of Cu3Sn and Kirkendall Voids in the Cu/Sn-Ag-Cu System by Minor Pd Alloying Cheng-En Ho; T. T. Kuo; C. C. Wang; W. H. Wu
亞洲大學 2003 Ontology-based knowledge fusion framework using graph partitioning T. T. Kuo;S. S. Tseng;Y. T. Lin

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