臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立臺灣大學	1995-01	Raman and Rutherford backscattering analyses of cubic SiC thin films grown on Si by vertical chemical vapor deposition	Feng, Z.C.; Tin, C.C.; Hu, R.; Williams, J.
國立臺灣大學	1994-01	Surface chemical states on 3C-SiC/Si epilayers	Wee, A. T. S.; Feng, Z. C.; Hgn, H. H.; Tan, K. L.; Tin, C. C.; Wu, R.; Coston, R.

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