|
|
???tair.name??? >
???browser.page.title.author???
|
"tin c c"???jsp.browse.items-by-author.description???
Showing items 1-10 of 12 (2 Page(s) Totally)
1 2 > >>
View [10|25|50] records per page
| 臺大學術典藏 |
2020-01-17T07:47:02Z |
Synchrotron radiation X-ray absorption and optical studies of cubic SiC films grown on Si by chemical vapor deposition
|
Tu, Y.-L.; Huang, Y.-H.; Kong, L.; Lee, K.-Y.; Jang, L.-Y.; Tin, C.-C.; Liu, C.-W.; Feng, Z.C.; KUNG-YEN LEE |
| 臺大學術典藏 |
2020-01-17T07:47:01Z |
Raman scattering and X-ray absorption from CVD grown 3C-SiC on Si
|
Feng, Z.C.; Chen, C.; Xu, Q.; Mendis, S.P.; Jang, L.-Y.; Tin, C.-C.; Lee, K.-Y.; Liu, C.W.; Wu, Z.; Qiu, Z.R.; KUNG-YEN LEE |
| 臺大學術典藏 |
2020-01-13T08:24:04Z |
Experimental investigation of cold storage in an encapsulated thermal storage tank
|
Ke, M.-C.; Lee, T.-S.; Tin, C.-C.; Chen, C.-L.; Chen, S.-L.; SIH-LI CHEN |
| 臺大學術典藏 |
2018-09-10T09:22:35Z |
4H-SiC wafers studied by X-ray absorption and Raman scattering
|
Xu, Q.; CHEE-WEE LIU et al.; Sun, H.Y.; Chen, C.; Jang, L.-Y.; Rusli; Mendis, S.P.; Tin, C.C.; Qiu, Z.R.; Wu, Z.; Liu, C.W.; Feng, Z.C. |
| 臺大學術典藏 |
2018-09-10T09:22:34Z |
Influence of surface roughness and interfacial layer on the infrared spectra of V-CVD grown 3C-SiC/Si (100) epilayers
|
Talwar, D.N.; Feng, Z.C.; Liu, C.W.; Tin, C.-C.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T09:22:33Z |
Raman scattering and X-ray absorption from CVD grown 3C-SiC on Si
|
Feng, Z.C.; Chen, C.; Xu, Q.; Mendis, S.P.; Jang, L.-Y.; Tin, C.-C.; Lee, K.-Y.; Liu, C.W.; Wu, Z.; Qiu, Z.R.; KUNG-YEN LEE; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T08:33:11Z |
Synchrotron radiation X-ray absorption and optical studies of cubic SiC films grown on Si by chemical vapor deposition
|
Tu, Y.-L.;Huang, Y.-H.;Kong, L.;Lee, K.-Y.;Jang, L.-Y.;Tin, C.-C.;Liu, C.-W.;Feng, Z.C.; Tu, Y.-L.; Huang, Y.-H.; Kong, L.; Lee, K.-Y.; Jang, L.-Y.; Tin, C.-C.; Liu, C.-W.; Feng, Z.C.; KUNG-YEN LEE; CHEE-WEE LIU |
| 國立臺灣大學 |
1996-01 |
Raman microprobe spectroscopy of low-pressure-grown 4H-SiC epilayers
|
Tin, C.C.; Hu, R.; Liu, J.; Vohra, Y.; Feng, Z.C. |
| 國立臺灣大學 |
1996-01 |
Structural, optical and surface science studies of 4H-SiC epilayers grown by low pressure chemical vapor deposition
|
Feng, Z.C.; Rohatgi, A.; Tin, C.C.; Hu, R.; Wee &, A.T.S.; Se, K.P. |
| 國立臺灣大學 |
1995-01 |
Combined Raman and luminescence assessment of epitaxial 6H-SiC films grown on 6H-SiC by low pressure vertical chemical vapor deposition
|
Feng, Z.C.; Tin, C.C.; Hu, R.; Yue, K.T. |
Showing items 1-10 of 12 (2 Page(s) Totally)
1 2 > >>
View [10|25|50] records per page
|
