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"tin c c"的相關文件
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| 臺大學術典藏 |
2020-01-17T07:47:02Z |
Synchrotron radiation X-ray absorption and optical studies of cubic SiC films grown on Si by chemical vapor deposition
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Tu, Y.-L.; Huang, Y.-H.; Kong, L.; Lee, K.-Y.; Jang, L.-Y.; Tin, C.-C.; Liu, C.-W.; Feng, Z.C.; KUNG-YEN LEE |
| 臺大學術典藏 |
2020-01-17T07:47:01Z |
Raman scattering and X-ray absorption from CVD grown 3C-SiC on Si
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Feng, Z.C.; Chen, C.; Xu, Q.; Mendis, S.P.; Jang, L.-Y.; Tin, C.-C.; Lee, K.-Y.; Liu, C.W.; Wu, Z.; Qiu, Z.R.; KUNG-YEN LEE |
| 臺大學術典藏 |
2020-01-13T08:24:04Z |
Experimental investigation of cold storage in an encapsulated thermal storage tank
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Ke, M.-C.; Lee, T.-S.; Tin, C.-C.; Chen, C.-L.; Chen, S.-L.; SIH-LI CHEN |
| 臺大學術典藏 |
2018-09-10T09:22:35Z |
4H-SiC wafers studied by X-ray absorption and Raman scattering
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Xu, Q.; CHEE-WEE LIU et al.; Sun, H.Y.; Chen, C.; Jang, L.-Y.; Rusli; Mendis, S.P.; Tin, C.C.; Qiu, Z.R.; Wu, Z.; Liu, C.W.; Feng, Z.C. |
| 臺大學術典藏 |
2018-09-10T09:22:34Z |
Influence of surface roughness and interfacial layer on the infrared spectra of V-CVD grown 3C-SiC/Si (100) epilayers
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Talwar, D.N.; Feng, Z.C.; Liu, C.W.; Tin, C.-C.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T09:22:33Z |
Raman scattering and X-ray absorption from CVD grown 3C-SiC on Si
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Feng, Z.C.; Chen, C.; Xu, Q.; Mendis, S.P.; Jang, L.-Y.; Tin, C.-C.; Lee, K.-Y.; Liu, C.W.; Wu, Z.; Qiu, Z.R.; KUNG-YEN LEE; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T08:33:11Z |
Synchrotron radiation X-ray absorption and optical studies of cubic SiC films grown on Si by chemical vapor deposition
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Tu, Y.-L.;Huang, Y.-H.;Kong, L.;Lee, K.-Y.;Jang, L.-Y.;Tin, C.-C.;Liu, C.-W.;Feng, Z.C.; Tu, Y.-L.; Huang, Y.-H.; Kong, L.; Lee, K.-Y.; Jang, L.-Y.; Tin, C.-C.; Liu, C.-W.; Feng, Z.C.; KUNG-YEN LEE; CHEE-WEE LIU |
| 國立臺灣大學 |
1996-01 |
Raman microprobe spectroscopy of low-pressure-grown 4H-SiC epilayers
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Tin, C.C.; Hu, R.; Liu, J.; Vohra, Y.; Feng, Z.C. |
| 國立臺灣大學 |
1996-01 |
Structural, optical and surface science studies of 4H-SiC epilayers grown by low pressure chemical vapor deposition
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Feng, Z.C.; Rohatgi, A.; Tin, C.C.; Hu, R.; Wee &, A.T.S.; Se, K.P. |
| 國立臺灣大學 |
1995-01 |
Combined Raman and luminescence assessment of epitaxial 6H-SiC films grown on 6H-SiC by low pressure vertical chemical vapor deposition
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Feng, Z.C.; Tin, C.C.; Hu, R.; Yue, K.T. |
| 國立臺灣大學 |
1995-01 |
Raman and Rutherford backscattering analyses of cubic SiC thin films grown on Si by vertical chemical vapor deposition
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Feng, Z.C.; Tin, C.C.; Hu, R.; Williams, J. |
| 國立臺灣大學 |
1994-01 |
Surface chemical states on 3C-SiC/Si epilayers
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Wee, A. T. S.; Feng, Z. C.; Hgn, H. H.; Tan, K. L.; Tin, C. C.; Wu, R.; Coston, R. |
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