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Showing items 11-12 of 12 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立臺灣大學 |
1995-01 |
Raman and Rutherford backscattering analyses of cubic SiC thin films grown on Si by vertical chemical vapor deposition
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Feng, Z.C.; Tin, C.C.; Hu, R.; Williams, J. |
國立臺灣大學 |
1994-01 |
Surface chemical states on 3C-SiC/Si epilayers
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Wee, A. T. S.; Feng, Z. C.; Hgn, H. H.; Tan, K. L.; Tin, C. C.; Wu, R.; Coston, R. |
Showing items 11-12 of 12 (1 Page(s) Totally) 1 View [10|25|50] records per page
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