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| 國立成功大學 |
2012 |
Investigating Degradation Behaviors Induced by DC and AC Bias-Stress under Light Illumination in InGaZnO Thin-Film Transistors
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Hsieh, TY (Hsieh, Tien-Yu); Chang, TC (Chang, Ting-Chang); Chen, TC (Chen, Te-Chih); Tsai, MY (Tsai, Ming-Yen); Chen, YT (Chen, Yu-Te); Chung, YC (Chung, Yi-Chen); Ting, HC (Ting, Hung-Che); Chen, CY (Chen, Chia-Yu) |
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