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國立交通大學 |
2017-04-21T06:48:15Z |
Insight of stress effect on the ONO stack layer in a SONOS-type flash memory cell
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Yeh, C. C.; Liao, Y. Y.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Kao, H. L.; Ou, T. F.; Chen, M. S.; Chen, Y. K.; Lai, E. K.; Shih, Y. H.; Ting, WenChi; Ku, Y. H. Joseph; Lit, Chih-Yuan |
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