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國立成功大學 |
2019 |
DIC image on FIB ring-core analysis of depth sensing residual stress measurement of thin films
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Pan, W.C.;Tsai, A.-T.;Cheng, F.-Y.;Chen, T.Y.-F.;Lin, M.-T. |
國立成功大學 |
2018 |
Digital image correlation of SEM images for surface deformation of CMOS IC
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Chen, T.Y.-F.;Chen, T.-C.;Cheng, F.-Y.;Tsai, A.-T.;Lin, M.-T. |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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