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Institution Date Title Author
國立成功大學 2016-08 Analysis of high-voltage metal-oxide-semiconductor transistors with gradual junction in the drift region Chen, Jone F.; Ai, Teng-Jen; Tsai, Yan-Lin; Hsu, Hao-Tang; Chen, Chih-Yuan; Hwang, Hann-Ping
國立成功大學 2016-01 Drift region doping effects on characteristics and reliability of high-voltage n-type metal-oxide-semiconductor transistors Chen, Jone F.; Chang, Chun-Po; Liu, Yu Ming; Tsai, Yan-Lin; Hsu, Hao-Tang; Chen, Chih-Yuan; Hwang, Hann-Ping

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