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| 國立交通大學 |
2019-04-02T06:01:00Z |
Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization
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Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao |
| 國立交通大學 |
2017-04-21T06:49:33Z |
A novel array-based test methodology for local process variation monitoring
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Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael S. -Y.; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L. |
| 國立交通大學 |
2014-12-08T15:36:24Z |
Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization
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Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao |
| 國立交通大學 |
2014-12-08T15:11:39Z |
A Novel Array-Based Test Methodology for Local Process Variation Monitoring
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Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael Shien-Yang; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Fisher, Philip A.; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L. |
| 國立彰化師範大學 |
1998-05 |
The Commissioning of a Flexible Low-Cost Multipurpose X-ray Beamline at SRRC
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Lee, Chih-Hao; Hwang, Ching-Shiang; Tseng, Poh-Kun; Tseng, Huan-Chi; Yu, Kuan-Li; Su, Wei-Chia; Chen, June-Rong; Lin, Tsang-Lang; Chang, Szu-Li |
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