| 淡江大學 |
2013 |
Optimal Design for Accelerated Destructive Degradation Tests
|
Tsai, Chih-Chun; Tseng, Sheng-Tsaing; Balakrishnan, N.; Lin, Chien-Tai |
| 淡江大學 |
2012-10-31 |
Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects
|
Tsai, Chih-Chun;Tseng, Sheng-Tsaing;Narayanaswamy, Balakrishnan |
| 淡江大學 |
2012-06 |
Optimal Design for Gamma Degradation Processes with Random Effects
|
Tsai, Chih-chun; Tseng, Sheng-tsaing; Narayanaswamy Balakrishnan |
| 淡江大學 |
2011-12 |
Mis-specification analyses of gamma and Wiener degradation processes
|
Tsai, Chih-Chun; Tseng, Sheng-Tsaing; Balakrishnan, N. |
| 淡江大學 |
2011-03 |
Optimal burn-in policy for highly reliable products using gamma degradation process
|
Tseng, Sheng-tsaing; Balakrishnan, N.; Tsai, Chih-chun |
| 淡江大學 |
2011-03 |
Optimal Sample Size Allocation for Accelerated Degradation Test Based on Wiener Process
|
Tseng, Sheng-tsaing; Balakrishnan, N.; Tsai, Chih-chun |
| 淡江大學 |
2009-12 |
Optimal step-stress accelerated degradation test plan for gamma degradation processes
|
Tseng, Sheng-tsaing; Balakrishnan, N.; Tsai, Chih-chun |
| 國立高雄第一科技大學 |
2002.10 |
Designing a Degradation Experiment with a Reciprocal Weibull Degradation Rate
|
Yu, Hong-Fwu;Tseng, Sheng-Tsaing |
| 國立高雄第一科技大學 |
2002.08 |
Designing a screening experiment for highly reliable products
|
Yu, Hong-Fwu;Tseng, Sheng-Tsaing |
| 國立臺灣科技大學 |
2000 |
Optimal Production Run Length for Products Sold with Warranty
|
Yeh, Ruey-Huei; Ho, Wen-Tsung; Tseng, Sheng-Tsaing |
| 國立高雄第一科技大學 |
1999.09 |
Designing a degradation experiment
|
Yu, Hong-Fwu;Tseng, Sheng-Tsaing |
| 國立臺灣科技大學 |
1999 |
Carryover Effects in Multi-Attribute Inspection
|
Yeh, Ruey-Huei; Tseng, Sheng-Tsaing; Ho, Wen-Tsung |
| 國立臺灣科技大學 |
1998 |
Imperfect Maintenance Policies for Deteriorating Production Systems
|
Tseng, Sheng-Tsaing; Yeh, Ruey-Huei; Ho, Wen-Tsung |
| 國立高雄第一科技大學 |
1998 |
On-Line Procedure For Terminating An Accelerated Degradation Test
|
Yu, Hong-Fwu;Tseng, Sheng-Tsaing |
| 國立高雄第一科技大學 |
1997.03 |
A termination rule for degradation experiments
|
Tseng, Sheng-Tsaing;Yu, Hong-Fwu |
