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Taiwan Academic Institutional Repository >
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"tseng wd"
Showing items 1-6 of 6 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:46:51Z |
Fuzzy-based CMOS circuit partitioning in built-in current testing
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Tseng, WD; Wang, KC |
| 國立交通大學 |
2014-12-08T15:45:29Z |
Fault coverage and defect level estimation models for partially testable MCMs
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Tseng, WD; Wang, K |
| 國立交通大學 |
2014-12-08T15:27:51Z |
DESIGN FOR DIAGNOSABILITY AND DIAGNOSTIC STRATEGIES OF WSI ARRAY ARCHITECTURES
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WANG, KC; TSENG, WD |
| 國立交通大學 |
2014-12-08T15:27:39Z |
Fuzzy-based circuit partitioning in built-in current testing
|
Tseng, WD; Wang, KC |
| 國立交通大學 |
2014-12-08T15:27:35Z |
Testable design and testing of MCMs based on multifrequency scan
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Tseng, WD; Wang, KC |
| 國立交通大學 |
2014-12-08T15:27:28Z |
Fault coverage estimation model for partially testable multichip modules
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Tseng, WD; Wang, KC |
Showing items 1-6 of 6 (1 Page(s) Totally)
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