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| 國立交通大學 |
2020-02-02T23:54:40Z |
Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative gamma-ray irradiation
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Sharma, Chandan; Modolo, Nicola; Chen, Hsi-Han; Tseng, Yang-Yan; Tang, Shun-Wei; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Singh, Rajendra; Wu, Tian-Li |
| 國立交通大學 |
2019-12-13T01:12:50Z |
Demonstration of Annealing-free Metal-Insulator-Semiconductor (MIS) Ohmic Contacts on a GaN Substrate using Low Work-function Metal Ytterbium (Yb) and Al2O3 Interfacial Layer
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Wu, Tian-Li; Tseng, Yang-Yan; Huang, Chih-Fang; Chen, Zih-Sin; Lin, Chih-Chien; Chung, Chung-Jen; Huang, Po-Kai; Kao, Kuo-Hsing |
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