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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:23:37Z |
Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability
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Yuan, Jiann-Shiun; Yen, Hsuan-Der; Chen, Shuyu; Wang, Ruey-Lue; Huang, Guo-Wei; Juang, Ying-Zong; Tu, Chih-Ho; Yeh, Wen-Kuan; Ma, Jun |
| 國立成功大學 |
2008-09 |
Degeneration of CMOS power cells after hot-carrier and load mismatch stresses
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Liu, Chien-Hsuan; Wang, Ruey-Lue; Su, Yan-Kuin; Tu, Chih-Ho; Juang, Ying-Zong |
| 國立成功大學 |
2007-01 |
The optimized geometry of the SiGeHBT power cell for 802.11 a WLAN applications
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Lin, Chien-Hsun; Su, Yan-Kuin; Juang, Ying-Zong; Chiu, Chin-Fong; Chang, Shoou-Jinn; Chen, Jone-Fang; Tu, Chih-Ho |
| 國立成功大學 |
2004-09 |
The effect of geometry on the noise characterization of SiGeHBTs and optimized device sizes for the design of low-noise amplifiers
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Lin, Chien-Hsun; Su, Yan-Kuin; Juang, Ying-Zong; Chuang, Ricky W.; Chang, Shoou-Jinn; Chen, Jone F.; Tu, Chih-Ho |
Showing items 1-4 of 4 (1 Page(s) Totally)
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