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國立臺灣科技大學 |
2015 |
A testable design for electrical interconnect tests of 3D ICs
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Odoriba, A.;Umezu, S.;Hashizume, M.;Yotsuyanagi, H.;Ali, F.A.B.;Lu, S.-K. |
國立臺灣科技大學 |
2015 |
Electrical interconnect test method of 3D ICs without boundary scan flip flops
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Hashizume, M;Umezu, S;Ikiri, Y;Ali, F.A.B;Yotsuyanagi, H;Lu, S.-K. |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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