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Institution Date Title Author
臺大學術典藏 2018-09-10T06:35:00Z STI Mechanical Stress Induced Subthreshold Kink Effect of 40nm PD SOI NMOS Devices J. B. kuo; M. Ma; C. T. Tsai; C. S. Yeh; D. Chen; JAMES-B KUO; I. Lin; V. Su
臺大學術典藏 2018-09-10T06:35:00Z Influence of STI-induced mechnical stress in kink effect of 65nm PD SOI CMOS devices I. Lin; V. Su; J. Kuo; R. Lee; G. Lin; D. Chen; C. Yeh; C. Tsai; M. Ma; JAMES-B KUO

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