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| 國立交通大學 |
2018-08-21T05:53:47Z |
Enhanced Reliability of In-Ga-ZnO Thin-Film Transistors Through Design of Dual Passivation Layers
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Abliz, Ablat; Wan, Da; Chen, Jui-Yuan; Xu, Lei; He, Jiawei; Yang, Yanbing; Duan, Haiming; Liu, Chuansheng; Jiang, Changzhong; Chen, Huipeng; Guo, Tailiang; Liao, Lei |
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