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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
元智大學 Feb-19 Interfacial reaction and mechanical reliability between Sn-3Ag-0.5Cu alloy and ultrathin-Ni(P)-type Au/Pd(P)/Ni(P)/Cu metallization pad Ying-Syuan Wu; Pei-Tzu Lee; Wan-Zhen Hsieh; Tsai-Tung Kuo; Cheng-En Ho
元智大學 Dec-14 Theoretical and experimental determination of Cu diffusivity in eutectic Sn-Ag system at 235-280 degrees C Cheng-En Ho; Wan-Zhen Hsieh; Chao-Sheng Liu; Cheng-Hsien Yang
元智大學 Aug-16 Comparative Study between Au/Pd/Cu and Au/Pd(P)/Cu Films in Soldering Applications Pei-Tzu Lee; Wan-Zhen Hsieh; Ting-Chun Yeh; Hsiao-Keng Wang; Cheng-En Ho
元智大學 Aug-16 Interfacial Microstructures and Mechanical Properties of Molten Sn Reacting with Ni-xP Films Wan-Zhen Hsieh; Md. Arifur Rahman; Tsung-Hsun Yang; Tsai-Tung Kuo; Cheng-En Ho
元智大學 2018-11-16 Synchrotron X-ray Nanodiffraction Study of Tin Whisker Growth Wan-Zhen Hsieh; Pei-Tzu Lee; Wei-Ling·Chou; Ching-Shun Ku; Cheng-En Ho
元智大學 2018-11-16 Characterization of Allotropic Phase Transformation of Hexagonal- into Monoclinic-Cu6Sn5 Using Synchrotron White X-ray Laue Diffraction Pei-Tzu Lee; Wan-Zhen Hsieh; Cheng-Yu Lee; Ching-Shun Ku; C. Robert Kao; Cheng-En Ho
元智大學 2018-11-16 Flexible Ni(P) Microstructure and Its Working Mechanism Wei-Ling Chou; Wan-Zhen Hsieh; Cheng-Yu Lee; Cheng-Sam Peng; Tsai-Tung Kuo; Cheng-En Ho
元智大學 2018-10-23 Toward A Better Understanding of Working Mechanism of Flexible Ni(P) Wei-Ling Chou; Wan-Zhen Hsieh; Cheng-Yu Lee; Cheng-Sam Peng; Tsai-Tung Kuo; Cheng-En Ho
元智大學 2018 錫之電遷移行為及其引發錫鬚生長機制 謝宛蓁; Wan-Zhen Hsieh
元智大學 2016-10-26 Reliability Testing of Au/Pd/Cu and Au/Pd(P)/Cu Surface Finishes at High Temperature Storage Cheng-En Ho; Wan-Zhen Hsieh; Pei-Tzu Lee; Tsai-Tung Kuo
元智大學 2014-10-22 Correlation between Ni(P) Depletion and IMCs Formation in Microelectronic Solder Joints with A Submicron Ni(P) Surface Finish Wan-Zhen Hsieh; Tsung-Hsun Yang; Wei-Hsiang Wu; Yu-Wei Lee; Cheng-En Ho
元智大學 2014-10-22 Unusual Cu Depletion in Line-bump Solder Joints under Current Stressing Cheng-En Ho; Cheng-Hsien Yang; Wan-Zhen Hsieh; Bo-Zong Chen

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