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Institution Date Title Author
國立臺中教育大學 2008-12 課堂虛擬實驗編輯工具之設計與實作 許馨仁; Sheu, Shin-Tzen; 陳柏戎; Chen, Po-Lung; 王崇旭; Wang, Chung-Shu
國立成功大學 2005-09 A high-efficiency CMOS image sensor with air gap in situ MicroLens (AGML) fabricated by 0.18-/-mu m CMOS technology Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Yao, L. L.; Wang, Wen-De; Wang, Chung-Shu; Chen, Shih-Fang
國立成功大學 2005-08 An effective method to improve the sensitivity of deep submicrometer CMOS image sensors Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Lin, J. S.; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Wang, Chung-Shu; Chen, Shih-Fang; Lin, Chun-Yue; Lin, Chun-Sheng; Chou, Tse-Heng
國立成功大學 2005-05 Color mixing improvement of CMOS image sensor with air-gap-guard ring in deep-submicrometer CMOS technology Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue
國立成功大學 2004-06 Dramatic reduction of optical crosstalk in deep-submicrometer CMOS imager with air gap guard ring Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue
國立成功大學 2002-03 On the high-performance Ti-salicide ULSI CMOS devices prepared by a borderless contact technique and double-implant structure Thei, Kong-Beng; Chuang, Hung-Ming; Yu, Kuo-Hui; Liu, Wen-Chau; Liu, Rong-Chau; Lin, Kun-Wei; Su, Chi-Wen; Ho, Chin-Shiung; Wuu, Shou-Gwo; Wang, Chung-Shu
國立成功大學 2001-08 A novel double ion-implant (DII) Ti-salicide technology for high-performance sub-0.25-mu m CMOS devices applications Thei, Kong-Beng; Liu, Wen-Chau; Chuang, Hung-Ming; Lin, Kun-Wei; Cheng, Chin-Chuan; Ho, Chin-Hsiung; Su, Chi-Wen; Wuu, Shou-Gwo; Wang, Chung-Shu
國立成功大學 2001-02 Nonsilicide source/drain pixel for 0.25-mu m CMOS image sensor Yaung, Dun-Nian; Wuu, Shou-Gwo; Fang, Yean-Kuen; Wang, Chung-Shu; Tseng, Chien-Hsien; Liang, Mon-Song
國立成功大學 2000-07 A new and improved borderless contact (BLC) structure for high-performance Ti-salicide in sub-quarter micron CMOS devices Liu, Wen-Chau; Thei, Kong-Beng; Wang, Wei-Chou; Pan, Hsi-Jen; Wuu, Shou-Gwo; Lei, Ming-Ta; Wang, Chung-Shu; Cheng, Shiou-Ying
國立成功大學 2000-07 The impacts of control gate voltage on the cycling endurance of split gate flash memory Huang, Kuo-Ching; Fang, Yean-Kuen; Yaung, Dun-Nian; Chen, Chii-Wen; Sung, Hung-Cheng; Kuo, Di-Son; Wang, Chung-Shu; Liang, Mong-Song

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