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Institution Date Title Author
元智大學 Oct-14 A hybrid method for segmented test data compression Lung-Jen Lee; Wang-Dauh Tseng; Yi-Yu Liu
元智大學 Mar-15 A hybrid method for segmented test data compression Lung-Jen Lee; Wang-Dauh Tseng; Yi-Yu Liu
元智大學 Jun-19 Multi-Scan Architecture with Scan Chain Disabling Technique for Capture Power Reduction JEN-CHENG YING; Wang-Dauh Tseng; WEN-JIIN TSAI
元智大學 Jul-19 Multi-Scan Architecture with Scan Chain Disabling Technique for Capture Power Reduction JEN-CHENG YING; Wang-Dauh Tseng; WEN-JIIN TSAI
元智大學 Jan-18 Asymmetry dual-LFSR reseeding for low power BIST Jen-Cheng Yin; Wang-Dauh Tseng; Wen-Jiin Tsai
元智大學 Apr-21 A Cascaded Multicasting Architecture for Test Data Compression Wang-Dauh Tseng
元智大學 Apr-21 A Cascaded Multicasting Architecture for Test Data Compression Wang-Dauh Tseng
元智大學 2022-08-02 Enhancing ILP-based Identification of Rational-Weight Threshold Logic Gates Ting-Yu Yeh; Yueh Cho; Yung-Chih Chen; Wang-Dauh Tseng
元智大學 2022-08-02 Enhancing ILP-based Identification of Rational-Weight Threshold Logic Gates Ting-Yu Yeh; Yueh Cho; Yung-Chih Chen; Wang-Dauh Tseng
元智大學 2022-08-02 Enhancing ILP-based Identification of Rational-Weight Threshold Logic Gates Ting-Yu Yeh; Yueh Cho; Yung-Chih Chen; Wang-Dauh Tseng
元智大學 2021-08-03 Test Data Compression Based on Diamond-Shaped Patterns Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng
元智大學 2021-08-03 Test Data Compression Based on Diamond-Shaped Patterns Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng
元智大學 2020/8/4 Test Power Reduction by Partially Specified Dual-LFSR Reseeding 陳勇志; Yi-An Chen; Wang-Dauh Tseng
元智大學 2018-12-10 Bipolar Dual-LFSR Reseeding for Low-Power Testing Jen-Cheng Ying; Wang-Dauh Tseng; Wen-Jiin Tsai
元智大學 2016-08-02 Multiple LFSRs reseeding for low power deterministic BIST Jen-Cheng Yin; Wang-Dauh Tseng; Wen-Jiin Tsai
元智大學 2016-05-20 Compensation Dual-LFSR Reseeding for Low Power BIST Jen-Cheng Yin; Wang-Dauh Tseng; Wen-Jiin Tsai
國立交通大學 2014-12-12T02:20:28Z 多晶片模組之可測試設計及測試策略 曾王道; Wang-Dauh Tseng; 王國禎
元智大學 2013-05-24 Featured Pattern Run Length Coding for Test Data Compression Lung-Jen Lee; Chih-Ho Shen; Wang-Dauh Tseng
元智大學 2012-12-10 Two-Way Multicasting for Test Data Compression Lung-Jen Lee; Wang-Dauh Tseng; Wei-Shun Chen
元智大學 2012-12-10 Dual-LFSR Reseeding for Low Power Testing Lung-Jen Lee; Wang-Dauh Tseng; Wen-Ting Yang
元智大學 2012-12-10 Deterministic ATPG for Low Capture Power Testing Lung-Jen Lee; Chia-Cheng He; Wang-Dauh Tseng
元智大學 2012-09 Reduction of Test Data Volume and Test Application Time by Scan Chain Disabling Technique Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學 2012-05-25 Improved Run-Length Codes for Test Data Compression Lung-Jen Lee; Wang-Dauh Tseng; Ting-Fang Liu
元智大學 2012-04 2(n) Pattern Run-Length for Test Data Compression Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.; Cheng-Ho Chang
元智大學 2011-12-02 Scan Chain Partitioning for Low Capture Power Testing Lung-Jen Lee; Zheng-Yi Xie; Wang-Dauh Tseng

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