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Showing items 21-31 of 31  (1 Page(s) Totally)
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Institution Date Title Author
元智大學 2012-12-10 Deterministic ATPG for Low Capture Power Testing Lung-Jen Lee; Chia-Cheng He; Wang-Dauh Tseng
元智大學 2012-09 Reduction of Test Data Volume and Test Application Time by Scan Chain Disabling Technique Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學 2012-05-25 Improved Run-Length Codes for Test Data Compression Lung-Jen Lee; Wang-Dauh Tseng; Ting-Fang Liu
元智大學 2012-04 2(n) Pattern Run-Length for Test Data Compression Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.; Cheng-Ho Chang
元智大學 2011-12-02 Scan Chain Partitioning for Low Capture Power Testing Lung-Jen Lee; Zheng-Yi Xie; Wang-Dauh Tseng
元智大學 2011-12-02 Combination of Broadcast Scheme with Scan Tree Architecture for Test Data Compression Lung-Jen Lee; Wang-Dauh Tseng
元智大學 2011-12-02 A Deterministic ATPG for Low Power Testing Lung-Jen Lee; Chia-Cheng He ; Wang-Dauh Tseng
元智大學 2011-12 Mismatch address indexing for test data compression Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學 2011-06 An Internal Pattern Run-Length Methodology for Slice Encoding Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學 2010-12 Cascaded broadcasting for test data compression Cheng-Ho Chang; Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學 2010-12 2n Pattern run-length for test data compression Cheng-Ho Chang; Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.

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