| 國立臺灣科技大學 |
2013 |
Measuring the process yield for simple linear profiles with one-sided specification
|
Wang, F.-K. |
| 國立臺灣科技大學 |
2013 |
Measuring process yield for nonlinear profiles
|
Wang, F.-K.;Guo, Y.-C. |
| 國立臺灣科技大學 |
2013 |
Measuring the process yield for simple linear profiles with one-sided specification
|
Wang, F.-K. |
| 國立臺灣科技大學 |
2013 |
Measuring process yield for nonlinear profiles
|
Wang, F.-K.;Guo, Y.-C. |
| 國立臺灣科技大學 |
2013 |
Digital convergence operation support system and process implementation based on service-oriented architecture
|
Huang, C.-I.;Wang, F.-K. |
| 國立臺灣科技大學 |
2013 |
An assessment of gauge repeatability and reproducibility with multiple characteristics
|
Wang F.-K. |
| 國立臺灣科技大學 |
2012 |
Forecasting analysis for global copper clad laminate market
|
Hsiao, Y.-Y.;Wang, F.-K. |
| 國立臺灣科技大學 |
2012 |
Combining diffusion and grey models based on evolutionary optimization algorithms to forecast motherboard shipments
|
Wang, F.-K.;Hsiao, Y.-Y.;Chang, K.-K. |
| 國立臺灣科技大學 |
2012 |
Lifetime predictions of LED-based light bars by accelerated degradation test
|
Wang, F.-K.;Chu, T.-P. |
| 國立臺灣科技大學 |
2012 |
Using a combined model to forecast the global paper laminate market
|
Wang, F.-K.;Hsiao, Y.-Y. |
| 國立臺灣科技大學 |
2012 |
The best vendor selection for conducting the recycled material based on a hybrid MCDM model combining DANP with VIKOR
|
Hsu, C.-H.;Wang, F.-K.;Tzeng, G.-H. |
| 國立臺灣科技大學 |
2012 |
Estimating the Burr XII parameters in constant-stress partially accelerated life tests under multiple censored data
|
Cheng, Y.-F.;Wang, F.-K. |
| 國立臺灣科技大學 |
2012 |
Partially accelerated life tests for the Weibull distribution under multiply censored data
|
Wang, F.K.;Cheng, Y.F.;Lu, W.L. |
| 國立臺灣科技大學 |
2012 |
Application of Lean Six Sigma to a panel equipment manufacturer
|
Wang, F.-K.;Chen, K.-S. |
| 國立臺灣科技大學 |
2012 |
Estimating the process yield of multiple characteristics with one-sided specifications
|
Wang, F.-K. |
| 國立臺灣科技大學 |
2012 |
Confidence intervals for two-dimensional data with circular tolerances in a gauge R&R study
|
Wang, F.-K.;Chern, H.L. |
| 國立臺灣科技大學 |
2012 |
A gauge study for dynamic light scattering and differential mobility analyzer instruments
|
Wang, F.K.;Chern, H.L.;Yu, T.C. |
| 國立臺灣科技大學 |
2012 |
Forecasting analysis for global copper clad laminate market
|
Hsiao, Y.-Y.;Wang, F.-K. |
| 國立臺灣科技大學 |
2011 |
Using adaptive network-based fuzzy inference system to forecast automobile sales
|
Wang, F.K.;Chang, K.K.;Tzeng, C.W. |
| 國立臺灣科技大學 |
2011 |
The Mean Time Between Failures for an LCD Panel
|
Wang, F.K.;Chu, T.P. |
| 國立臺灣科技大學 |
2011 |
M-estimator with asymmetric influence function for estimating the Burr type III parameters with outliers
|
Wang, F.K.;Lee, C.W. |
| 國立臺灣科技大學 |
2011 |
An M-Estimator for Estimating the Extended Burr Type III Parameters with Outliers
|
Wang, F.K.;Lee, C.W. |
| 國立臺灣科技大學 |
2010 |
TFT-LCD panel life study
|
Chu T.-P.; Sheu S.-H.; Wang F.-K. |
| 國立臺灣科技大學 |
2010 |
Robust regression for estimating the Burr XII parameters with outliers
|
Wang F.-K.; Cheng Y.-F. |
| 國立臺灣科技大學 |
2010 |
Process-oriented basis representation for a multivariate gauge study
|
Wang F.-K.; Chien T.-W. |
| 國立臺灣科技大學 |
2010 |
Adaptive neuro-fuzzy inference system for combined forecasts in a panel manufacturer
|
Wang F.-K.; Chang K.-K. |
| 國立臺灣科技大學 |
2010 |
EM algorithm for estimating the Burr XII parameters with multiple censored data
|
Wang F.K.; Cheng Y.F. |
| 國立臺灣科技大學 |
2010 |
A general procedure for process yield with multiple characteristics
|
Wang F.-K. |
| 國立臺灣科技大學 |
2010 |
Applying Lean Six Sigma and TRIZ methodology in banking services
|
Wang, F.K.;Chen, K.S. |
| 國立臺灣科技大學 |
2009 |
Modified diffusion model with multiple products using a hybrid GA approach
|
Wang, F. K. ; Chang, K. K. |
| 國立臺灣科技大學 |
2009 |
Using fuzzy neural networks for combined forecasts
|
Wang, F. K. ; Cheng, K. K. |
| 國立臺灣科技大學 |
2008 |
Process yield with measurement errors in semiconductor manufacturing
|
Wang, F. K. |
| 國立臺灣科技大學 |
2008 |
Applying six sigma to collaborative forecasting
|
Chang, K. K. ; Wang, F. K. |
| 國立臺灣科技大學 |
2008 |
Forecasting for the LCD monitor market
|
Lo, S. L. ; Wang, F. K. ; Lin, J. T. |
| 國立臺灣科技大學 |
2008 |
Applying bootstrap method to the typeⅠ& typeⅡ errors in the measurement system
|
Wang, F. K. ; Yang, S. W. |
| 國立臺灣科技大學 |
2008 |
Lot release times and dispatching rule for a TFT-LCD cell process
|
Lin, J. T. ; Wang, F. K. ; Peng, C. C. |
| 國立臺灣科技大學 |
2008 |
Applying six sigma methodology to collaborative forecasting
|
Chang, K.K.;Wang, F.K. |
| 國立臺灣科技大學 |
2008 |
Applying bootstrap method to the types I-II errors in the measurement system
|
Wang, F.K.;Yang, S.W. |
| 國立臺灣科技大學 |
2007 |
Multivariate capability indices: distributional and inferential properties
|
Pearn, W. L. ; Wang, F. K. ; Yen, C. H. |
| 國立臺灣科技大學 |
2007 |
Applying principal component analysis to a GR&R study
|
Wang, F. K. ; Yang, C. W. |
| 國立臺灣科技大學 |
2007 |
Product mix in the TFT-LCD industry
|
Wang, F. K; Du, T. ; Wen, D. |
| 國立臺灣科技大學 |
2007 |
Applying capability index to supply chain network
|
Wang, F. K. ; Du, T. |
| 國立臺灣科技大學 |
2007 |
A real-time vehicle-dispatching system for consolidating milk runs
|
Du, T. ; Wang, F. K. ; Lu, P. Y. |
| 國立臺灣科技大學 |
2007 |
Comparison of multivariate process capability indices in Encyclopedia of Statistics in Quality and Reliability
|
Wang, F. K. |
| 國立臺灣科技大學 |
2007 |
Apply FVT with Lean-Six-Sigma to upgrade value of Outputs
|
Lee, LarryJ. H. ; Wang, F. K. |
| 國立臺灣科技大學 |
2007 |
Applying six sigma to improve performance in collaborative forecast
|
Chang, K. K. ; Wang, F. K. |
| 國立臺灣科技大學 |
2007 |
Applying capability index to the supply network analysis
|
Wang, F.-K.;Du, T. |
| 國立臺灣科技大學 |
2006 |
Measuring production yield for processes with multiple quality characteristics
|
Pearn, W. L. ; Wang, F. K. ; Yen, C. H. |
| 國立臺灣科技大學 |
2006 |
Quality evaluation of a manufactured product with multiple characteristics
|
Wang, F. K. |
| 國立臺灣科技大學 |
2006 |
A hybrid Push/Pull- dispatching rule for a photobay in a 300mm wafer fab
|
Lin, J. T. ; Wang, F. K; Chang, Y. M. |
