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Showing items 11-20 of 113 (12 Page(s) Totally)
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| 臺大學術典藏 |
2021-08-03T01:43:31Z |
Comparative Study of Li-CO2and Na-CO2Batteries with Ru@CNT as a Cathode Catalyst
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Thoka S;Tsai C.-M;Tong Z;Jena A;Wang F.-M;Hsu C.-C;Chang H;Hu S.-F;Liu R.-S.; Thoka S; Tsai C.-M; Tong Z; Jena A; Wang F.-M; Hsu C.-C; Chang H; Hu S.-F; Liu R.-S.; RU-SHI LIU |
| 臺大學術典藏 |
2021-08-03T01:43:28Z |
High-performance Na-CO2batteries with ZnCo2O4@CNT as the cathode catalyst
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Thoka S;Tong Z;Jena A;Hung T.-F;Wu C.-C;Chang W.-S;Wang F.-M;Wang X.-C;Yin L.-C;Chang H;Hu S.-F;Liu R.-S.; Thoka S; RU-SHI LIU et al. |
| 臺大學術典藏 |
2021-08-03T01:43:22Z |
Spinel Zinc Cobalt Oxide (ZnCo2O4) Porous Nanorods as a Cathode Material for Highly Durable Li-CO2 Batteries
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Thoka S;Chen C.-J;Jena A;Wang F.-M;Wang X.-C;Chang H;Hu S.-F;Liu R.-S.; Thoka S; Chen C.-J; Jena A; Wang F.-M; Wang X.-C; Chang H; Hu S.-F; Liu R.-S.; RU-SHI LIU |
| 臺大學術典藏 |
2020-03-02T05:45:40Z |
A high-density microelectrode-tissue-microelectrode sandwich platform for application of retinal circuit study
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Yang F.; Yang C.-H.; Wang F.-M.; Cheng Y.-T.; Teng C.-C.; LI-JEN LEE; Fan L.-S. |
| 臺大學術典藏 |
2020-01-17T07:45:18Z |
A fully model-based methodology for simultaneously correcting EUV mask shadowing and optical proximity effects with improved pattern transfer fidelity and process windows
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Ng, P.C.W.; Tsai, K.-Y.; Lee, Y.-M.; Pei, T.-H.; Wang, F.-M.; Li, J.-H.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:17Z |
Efficient scattering simulations for equivalent extreme ultraviolet mask multilayer structures by modified transmission line theory and finite-difference time-domain method
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Lee, Y.-M.; Li, J.-H.; Ng, P.C.W.; Pei, T.-H.; Wang, F.-M.; Tsai, K.-Y.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:17Z |
Using transmission line theory to calculate equivalent refractive index of EUV mask multilayer structures for efficient scattering simulation by finite-difference time-domain method
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Lee, Y.-M.; Li, J.-H.; Ng, P.C.W.; Pei, T.-H.; Wang, F.-M.; Tsai, K.-Y.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:16Z |
Erratum: Fully model-based methodology for simultaneous correction of extreme ultraviolet mask shadowing and proximity effects (Journal of Micro/ Nanolithography, MEMS, and MOEMS (2011) 10 (013004))
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Ng, P.C.W.; Tsai, K.-Y.; Lee, Y.-M.; Wang, F.-M.; Li, J.-H.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:16Z |
Fully model-based methodology for simultaneous correction of extreme ultraviolet mask shadowing and proximity effects
|
Ng, P.C.W.; Tsai, K.-Y.; Lee, Y.-M.; Wang, F.-M.; Li, J.-H.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:12Z |
Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises
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Lee, Y.-M.; Li, J.-H.; Wang, F.-M.; Cheng, H.-H.; Shen, Y.-T.; Tsai, K.-Y.; Shieh, J.J.; Chen, A.C.; JIA-HAN LI |
Showing items 11-20 of 113 (12 Page(s) Totally)
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