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Institution Date Title Author
國立高雄大學 2009-03 The Impact of Strain Technology on FUSI Gate SOI CMOSFET Yeh, Wen-Kuan; Wang, Jean-An; Tsai, Ming-Hsing; Lin, Chien-Ting; Chen, Po-Ying
國立高雄大學 2008 The impact of stain technology on FUSI gate SOI CMOSFET and device performance enhancement for 45nm node and beyond Yeh, Wen-Kuan; Wang, Jean-An; Lin, Chien-Ting; Cheng, Li-Wei; Ma, Mike

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