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東海大學 |
2005 |
Mechanisms and solutions to gate oxide degradation in flash memory by tunnel-oxide nitridation engineering
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Wang, S.-Y.ab , Chin, C.-Y.a, Jeng, P.-R.a, Yang, L.-W.a, Chen, M.-S.a, Huang, C.-T.a, Gong, J.b, Chen, K.-C.a, Ku, J.a, Lu, C.-Y. |
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