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| 東海大學 |
2007-04-15 |
Reliability and processing effects of bandgap engineered sonos (BE-SONOS) flash memory
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Wang, S.-Y.?,?Lue, H.-T.,?Lai, E.-K.,?Yang, L.-W.,?Yang, T.,?Chen, K.-C.,?Gong, J.,?Hsieh, K.-Y.,?Liu, R.,?Lu, C.Y. |
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