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Showing items 1-11 of 11 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:48:23Z |
High-Reliability Dynamic-Threshold Source-Side Injection for 2-Bit/Cell With MLC Operation of Wrapped Select-Gate SONOS in NOR-Type Flash Memory
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Wang, Kuan-Ti; Chao, Tien-Sheng; Wu, Woei-Cherng; Yang, Wen-Luh; Lee, Chien-Hsing; Hsieh, Tsung-Min; Liou, Jhyy-Cheng; Wang, Shen-De; Chen, Tzu-Ping; Chen, Chien-Hung; Lin, Chih-Hung; Chen, Hwi-Huang |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Effect of chemical mechanical polish process on low-temperature poly-SiGe thin-film transistors
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Shieh, Ming-Shan; Chen, Chih-Yang; Hsu, Yuan-Jiun; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Process induced instability and reliability issues in low temperature poly-Si thin film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:31Z |
Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:11Z |
A reliability model for low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Lee, Po-Hao; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Ma, Ming-Wen; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:39Z |
Analysis of negative bias temperature instability in body-tied low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:26Z |
Dynamic negative bias temperature instability in low-temperature poly-Si thin-film transistors
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Chen, Chih-Yang; Wang, Tong-Yi; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:09:26Z |
High-Speed Multilevel Wrapped-Select-Gate SONOS Memory Using a Novel Dynamic Threshold Source-Side-Injection (DTSSI) Programming Method
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Wang, Kuan-Ti; Chao, Tien-Sheng; Wu, Woei-Cherng; Chiang, Tsung-Yu; Wu, Yi-Hong; Yang, Wen-Luh; Lee, Chien-Hsing; Hsieh, Tsung-Min; Liou, Jhyy-Cheng; Wang, Shen-De; Chen, Tzu-Ping; Chen, Chien-Hung; Lin, Chih-Hung; Chen, Hwi-Huang |
| 國立交通大學 |
2014-12-08T15:08:28Z |
Physical Mechanism of High-Programming-Efficiency Dynamic-Threshold Source-Side Injection in Wrapped-Select-Gate SONOS for NOR-Type Flash Memory
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Wang, Kuan-Ti; Chao, Tien-Sheng; Chiang, Tsung-Yu; Wu, Woei-Cherng; Kuo, Po-Yi; Wu, Yi-Hong; Lu, Yu-Lun; Liao, Chia-Chun; Yang, Wen-Luh; Lee, Chien-Hsing; Hsieh, Tsung-Min; Liou, Jhyy-Cheng; Wang, Shen-De; Chen, Tzu-Ping; Chen, Chien-Hung; Lin, Chih-Hung; Chen, Hwi-Huang |
Showing items 1-11 of 11 (1 Page(s) Totally)
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