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Taiwan Academic Institutional Repository >
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"wang tahui"
Showing items 106-115 of 122 (13 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:22:46Z |
Random Telegraph Noise in 1X-nm CMOS Silicide Contacts and a Method to Extract Trap Density
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Chen, Min-Cheng; Lin, Chia-Yi; Chen, Bo-Yuan; Lin, Chang-Hsien; Huang, Guo-Wei; Ho, Chia-Hua; Wang, Tahui; Hu, Chenming; Yang, Fu-Liang |
| 國立交通大學 |
2014-12-08T15:22:37Z |
V-t Retention Distribution Tail in a Multitime-Program MLC SONOS Memory Due to a Random-Program-Charge-Induced Current-Path Percolation Effect
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Chung, Yueh-Ting; Huang, Tzu-I; Li, Chi-Wei; Chou, You-Liang; Chiu, Jung-Piao; Wang, Tahui; Lee, M. Y.; Chen, Kuang-Chao; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:21:24Z |
A Comparative Study of NBTI and RTN Amplitude Distributions in High-kappa Gate Dielectric pMOSFETs
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Chiu, J. P.; Chung, Y. T.; Wang, Tahui; Chen, Min-Cheng; Lu, C. Y.; Yu, K. F. |
| 國立交通大學 |
2014-12-08T15:21:22Z |
Investigation of Post-NBT Stress Current Instability Modes in HfSiON Gate Dielectric pMOSFETs by Measurement of Individual Trapped Charge Emissions
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Ma, H. C.; Chiu, J. P.; Tang, C. J.; Wang, Tahui; Chang, C. S. |
| 國立交通大學 |
2014-12-08T15:21:21Z |
Program Charge Effect on Random Telegraph Noise Amplitude and Its Device Structural Dependence in SONOS Flash Memory
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Chiu, J. P.; Chou, Y. L.; Ma, H. C.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:16:28Z |
Characteristics and physical mechanisms of positive bias and temperature stress-induced drain current degradation in HfSiON nMOSFETs
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Chan, Chien-Tai; Tang, Chun-Jung; Wang, Tahui; Wang, Howard C. -H.; Tang, Denny D. |
| 國立交通大學 |
2014-12-08T15:15:50Z |
Physics and characterization of various hot-carrier degradation modes in LDMOS by using a three-region charge-pumping technique
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Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L. |
| 國立交通大學 |
2014-12-08T15:15:37Z |
Extraction of nitride trap density from stress induced leakage current in silicon-oxide-nitride-oxide-silicon flash memory
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Gu, Shaw-Hung; Wang, Tahui; Lu, Wen-Pin; Ku, Yen-Hui Joseph; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:14:59Z |
Numerical simulation of bottom oxide thickness effect on charge retention in SONOS flash memory cells
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Gu, Shaw-Hung; Hsu, Chih-Wei; Wang, Tahui; Lu, Wen-Pin; Ku, Yen-Hui Joseph; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:13:01Z |
Effects of width scaling and layout variation on dual damascene copper interconnect electromigration
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Lin, M. H.; Chang, K. P.; Su, K. C.; Wang, Tahui |
Showing items 106-115 of 122 (13 Page(s) Totally)
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