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Taiwan Academic Institutional Repository >
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"wang tahui"
Showing items 21-30 of 122 (13 Page(s) Totally)
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| 國立交通大學 |
2018-01-24T07:36:25Z |
電阻式記憶體及SONOS快閃式記憶體中介電層缺陷造成之可靠度效應研究
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鍾岳庭; 汪大暉; Chung, Yueh-Ting; Wang, Tahui |
| 國立交通大學 |
2017-04-21T06:56:32Z |
SET/RESET Cycling-Induced Trap Creation and SET-Disturb Failure Time Degradation in a Resistive-Switching Memory
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Chung, Yueh-Ting; Su, Po-Cheng; Lin, Wen-Jie; Chen, Min-Cheng; Wang, Tahui |
| 國立交通大學 |
2017-04-21T06:56:17Z |
Electric Field Induced Nitride Trapped Charge Lateral Migration in a SONOS Flash Memory
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Liu, Yu-Heng; Jiang, Cheng-Min; Chen, Wei-Chun; Wang, Tahui; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, Kuang-Chao; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:56:07Z |
Electric Field Induced Nitride Trapped Charge Lateral Migration in a SONOS Flash Memory
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Liu, Yu-Heng; Jiang, Cheng-Min; Chen, Wei-Chun; Wang, Tahui; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, Kuang-Chao; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:55:39Z |
Poly-Silicon Trap Position and Pass Voltage Effects on RTN Amplitude in a Vertical NAND Flash Cell String
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Chou, Y. L.; Wang, Tahui; Lin, Mercator; Chang, Y. W.; Liu, Lenvis; Huang, S. W.; Tsai, W. J.; Lu, T. C.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:50:09Z |
Silicide Barrier Engineering Induced Random Telegraph Noise in 1Xnm CMOS Contacts
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Chen, Min-Cheng; Lin, Chia-Yi; Chen, Bo-Yuan; Lin, Chang-Hsien; Huang, Guo-Wei; Huang, Chien-Chao; Ho, ChiaHua; Wang, Tahui; Hu, Chenming; Yang, Fu-Liang |
| 國立交通大學 |
2017-04-21T06:49:47Z |
Estimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging Electrode
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Chen, Min-Cheng; Chen, Hsiao-Chien; Lee, Ta-Hsien; Lin, Yu-Hsien; Shih, Jyun-Hung; Wang, Bo-Wei; Hou, Yun-Fang; Chen, Yi-Ju; Lin, Chia-Yi; Lin, Chang-Hsien; Hsieh, Yi-Ping; Ho, ChiaHua; Hua, Mu-Yi; Qiu, Jian-Tai; Wang, Tahui; Yang, Fu-Liang |
| 國立交通大學 |
2017-04-21T06:49:43Z |
Investigation of the strained PMOS on (110) substrate
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Tang, Chun-Jung; Huang, Shih-Hian; Wang, Tahui; Chang, Chih-Sheng |
| 國立交通大學 |
2017-04-21T06:49:40Z |
Cell Endurance Prediction from a Large-area SONOS Capacitor
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Lee, C. H.; Tu, W. H.; Gu, S. H.; Wu, C. W.; Lin, S. W.; Yeh, T. H.; Chen, K. F.; Chen, Y. J.; Hsieh, J. Y.; Huang, I. J.; Zous, N. K.; Han, T. T.; Chen, M. S.; Lu, W. P.; Chen, K. C.; Wang, Tahui; Lu, C. Y. |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Overall Operation Considerations for a SONOS-based Memory
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Lee, C. H.; Tu, W. H.; Chong, L. H.; Gu, S. H.; Chen, K. F.; Chen, Y. J.; Hsieh, J. Y.; Huang, I. J.; Zous, N. K.; Han, T. T.; Chen, M. S.; Lu, W. P.; Chen, K. C.; Wang, Tahui; Lu, C. Y. |
Showing items 21-30 of 122 (13 Page(s) Totally)
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