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Showing items 1-50 of 121  (3 Page(s) Totally)
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Institution Date Title Author
國家衛生研究院 2025-02-12 Time allocation to physical activity and sedentary behaviour and its iImpact on sarcopenia risk: A systematic review and meta-analysis Chien, SY;Wang, TH;Tzeng, YL;Lu, SH;Chang, TS
國家衛生研究院 2025-02-10 FOXO3a/miR-4259-driven LDHA expression as a key mechanism of gemcitabine sensitivity in pancreatic ductal adenocarcinoma Hsu, TW;Wang, WY;Chen, HA;Wang, TH;Su, CM;Liao, PH;Chen, AL;Tsai, KY;Kokotos, G;Kuo, CC;Chiu, CF;Su, YH
國家衛生研究院 2025-02-06 Association between early retirement and risk of frailty in later life: A population-based longitudinal study Wang, TH;Chien, SY;Cheng, WJ;Huang, YW;Wang, SH;Huang, WL;Tzeng, YL;Hsu, CC;Chen, WJ;Wu, CS
國家衛生研究院 2025-01-24 Dose-response analysis of music intervention for improving delirium in intensive care unit patients: A systematic review and meta-analysis Dai, RS;Wang, TH;Chien, SY;Tzeng, YL
國家衛生研究院 2024-11-22 The role of PM2.5 exposure in lung cancer: Mechanisms, genetic factors, and clinical implications Chen, CY;Huang, KY;Chen, CC;Chang, YH;Li, HJ;Wang, TH;Yang, PC
國家衛生研究院 2024-05-20 Associations of early retirement and mortality risk: A population-based study in Taiwan Wang, TH;Chien, SY;Cheng, WJ;Huang, YW;Wang, SH;Huang, WL;Tzeng, YL;Hsu, CC;Wu, CS
國家衛生研究院 2023-09-07 Controlled encapsulation of gold nanoparticles into Zr-metal-organic frameworks with improved detection limitation of volatile organic compounds via surface-enhanced raman scattering Lam, PK;Liao, JJ;Lin, MC;Li, YH;Wang, TH;Huang, HK;Hsu, YA;Hsieh, HYP;Kuan, PY;Chen, CT;Hao, GX;Tsung, CK;Wu, KCW;Šutka, A;Kinka, M;Chou, LY;Shieh, FK
臺大學術典藏 2021-11-03T01:38:42Z Versatile Pt(II) Pyrazolate Complexes: Emission Tuning via Interplay of Chelate Designs and Stacking Assemblies Ko, CL; Hung, WY; Chen, PT; Wang, TH; Hsu, HF; Liao, JL; Ly, KT; Wang, SF; Yu, CH; Liu, SH; Lee, GH; Tai, WS; Chou, PT; Chi, Y; PI-TAI CHOU
臺大學術典藏 2021-11-03T01:38:38Z Overcoming the energy gap law in near-infrared OLEDs by exciton-vibration decoupling Wei, YC; Wang, SF; Hu, Y; Liao, LS; Chen, DG; Chang, KH; Wang, CW; Liu, SH; Chan, WH; Liao, JL; Hung, WY; Wang, TH; Chen, PT; Hsu, HF; Chi, Y; Chou, PT; PI-TAI CHOU
國家衛生研究院 2021-07-26 Cancer registry coding via hybrid neural symbolic systems in the cross-hospital setting Dai, HJ;Yang, YH;Wang, TH;Lin, YJ;Lu, PJ;Wu, CY;Chang, YC;Lee, YQ;Zhang, YC;Hsu, YC;Wu, HH;Ke, CR;Huang, CJ;Wang, YT;Yang, SF;Hsiao, KC;Liu, KJ;Chen, LT;Chang, IS;Chao, KSC;Liu, TW
中山醫學大學 2020 Flavonoids Identification and Pancreatic Beta-Cell Protective Effect of Lotus Seedpod Lee, MS; Chyau, CC; Wang, CP; Wang, TH; Chen, JH; Lin, HH
中山醫學大學 2020 Structural Validity of an ICF-Based Measure of Activity and Participation for Children in Taiwan's Disability Eligibility Determination System Hwang, AW; Yen, CF; Liao, HF; Chi, WC; Liou, TH; Chang, BS; Wu, TF; Kang, LJ; Lu, SJ; Simeonsson, RJ; Wang, TH; Bedell, G
國立交通大學 2019-04-02T06:04:36Z CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS HUANG, CM; WANG, TH; CHEN, T; PENG, NC; CHANG, A; SHONE, FC
臺大學術典藏 2018-09-10T06:47:20Z Effective prevention and treatment of Helicobacter pylori infection using a combination of catechins and sialic acid in AGS cells and BALB/c mice Yang, JC;Shun, CT;Chien, CT;Wang, TH.; Yang, J.-C. and Shun, C.-T. and Chien, C.-T. and Wang, T.-H.; Yang, JC; JYH-CHIN YANG; CHIA-TUNG SHUN; Shun, CT; Chien, CT; Wang, TH.
國立交通大學 2018-08-21T05:53:38Z A global pinching theorem for surfaces with constant mean curvature in S-3 Hsu, YJ; Wang, TH
國立交通大學 2014-12-08T15:48:54Z Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique Wang, TH; Chang, TE; Chiang, LP; Wang, CH; Zous, NK; Huang, CM
國立交通大學 2014-12-08T15:48:47Z Characterization of various stress-induced oxide traps in MOSFET's by using a subthreshold transient current technique Wang, TH; Chiang, LP; Zous, NK; Chang, TE; Huang, C
國立交通大學 2014-12-08T15:46:18Z Transient effects of positive oxide charge on stress-induced leakage current in tunnel oxides Zous, NK; Wang, TH; Yeh, CC; Tsai, CW; Huang, CM
國立交通大學 2014-12-08T15:46:14Z A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's Wang, TH; Chiang, LP; Zous, NK; Hsu, CF; Huang, LY; Chao, TS
國立交通大學 2014-12-08T15:44:34Z Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology Wang, HCH; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH
國立交通大學 2014-12-08T15:44:15Z Interface induced uphill diffusion of boron: An effective approach for ultrashallow junction Wang, HCH; Wang, CC; Chang, CS; Wang, TH; Griffin, PB; Diaz, CH
國立交通大學 2014-12-08T15:43:58Z On-chip ESD protection design by using polysilicon diodes in CMOS process Ker, MD; Chen, TY; Wang, TH; Wu, CY
國立交通大學 2014-12-08T15:43:09Z Inequalities between Dirichlet and Neumann eigenvalues for domains in spheres Hsu, YJ; Wang, TH
國立交通大學 2014-12-08T15:43:07Z A global pinching theorem for surfaces with constant mean curvature in S-3 Hsu, YJ; Wang, TH
國立交通大學 2014-12-08T15:42:55Z Arsenic/phosphorus LDD optimization by taking advantage of phosphorus transient enhanced diffusion for high voltage input/output CMOS devices Wang, HCH; Wang, CC; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH
國立交通大學 2014-12-08T15:42:37Z Enhanced negative-bias-temperature instability of P-channel metal-oxide-semiconductor transistors due to plasma charging damage Lee, DY; Lin, HC; Wang, MF; Tsai, MY; Huang, TY; Wang, TH
國立交通大學 2014-12-08T15:41:47Z Role of positive trapped charge in stress-induced leakage current for flash EEPROM devices Wang, TH; Zous, NK; Yeh, CC
國立交通大學 2014-12-08T15:41:10Z A novel soft-program for a narrow erased state Vt distribution, read disturbance suppression and over-program annihilation in multilevel cell flash memories Yeh, CC; Fan, TH; Lu, TC; Wang, TH; Pan, S; Lu, CY
國立交通大學 2014-12-08T15:41:07Z Auger recombination-enhanced hot carrier degradation in nMOSFETs with a forward substrate bias Tsai, CW; Chen, MC; Ku, SH; Wang, TH
國立交通大學 2014-12-08T15:39:34Z Positive oxide charge-enhanced read disturb in a localized trapping storage flash memory cell Tsai, WJ; Yeh, CC; Zous, NK; Liu, CC; Cho, SK; Wang, TH; Pan, SC; Lu, CY
國立交通大學 2014-12-08T15:39:14Z An endurance evaluation method for flash EEPROM Zous, NK; Chen, YJ; Chin, CY; Tsai, WJ; Lu, TC; Chen, MS; Lu, WP; Wang, TH; Pan, SC; Lu, CY
國立交通大學 2014-12-08T15:38:52Z Temperature effect on read current in a two-bit nitride-based trapping storage flash EEPROM cell Liu, MY; Chang, YW; Zous, NK; Yang, I; Lu, TC; Wang, TH; Ting, WC; Ku, J; Lu, CY
國立交通大學 2014-12-08T15:38:44Z Pocket implantation effect on drain current flicker noise in analog nMOSFET devices Wu, JW; Cheng, CC; Chiu, KL; Guo, JC; Lien, WY; Chang, CS; Huang, GW; Wang, TH
國立交通大學 2014-12-08T15:38:41Z Soft breakdown enhanced hysteresis effects in ultrathin oxide silicon-on-insulator metal-oxide-semiconductor field effect transistors Chen, MC; Ku, SH; Chan, CT; Wang, TH
國立交通大學 2014-12-08T15:38:37Z A novel erase scheme to suppress overerasure in a scaled 2-bit nitride storage flash memory cell Yeh, CC; Wang, TH; Tsai, WJ; Lu, TC; Liao, YY; Chen, HY; Zous, NK; Ting, WC; Ku, J; Lu, CY
國立交通大學 2014-12-08T15:38:37Z Lateral migration of trapped holes in a nitride storage flash memory cell and its qualification methodology Zous, NK; Lee, MY; Tsai, WJ; Kuo, A; Huang, LT; Lu, TC; Liu, CJ; Wang, TH; Lu, WP; Ting, WC; Ku, J; Lu, CY
國立交通大學 2014-12-08T15:38:31Z Comparison of oxide breakdown progression in ultra-thin oxide silicon-on-insulator and bulk metal-oxide-semiconductor field effect transistors Chen, MC; Ku, SH; Chan, CT; Wang, TH
國立交通大學 2014-12-08T15:27:51Z INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS WANG, TH; CHANG, TE; HUANG, CM
國立交通大學 2014-12-08T15:27:37Z Field enhanced oxide charge detrapping in n-MOSFET's Wang, TH; Chang, TE; Chiang, LP; Huang, C
國立交通大學 2014-12-08T15:27:37Z Mechanisms and characteristics of oxide charge detrapping in n-MOSFET's Wang, TH; Chang, TE; Chiang, LP; Huang, CM; Guo, JC
國立交通大學 2014-12-08T15:27:30Z A new technique to measure an oxide trap density in a hot carrier stressed n-MOSFET Wang, TH; Chiang, LP; Chang, TE; Zous, NK; Shen, KY; Huang, C
國立交通大學 2014-12-08T15:27:29Z Investigation of oxide charge trapping and detrapping in a n-MOSFET Wang, TH; Chang, TE; Chiang, LP; Zous, NK; Huang, C
國立交通大學 2014-12-08T15:27:27Z Characterization of various stress-induced oxide traps in MOSFET's by using a novel transient current technique Wang, TH; Chiang, LP; Zous, NK; Chang, TE; Huang, C
國立交通大學 2014-12-08T15:27:15Z Voltage scaling and temperature effects on drain leakage current degradation in a hot carrier stressed n-MOSFET Wang, TH; Hsu, CF; Chiang, LP; Zous, NK; Chao, TS; Chang, CY
國立交通大學 2014-12-08T15:27:09Z A comparative study of SILC transient characteristics and mechanisms in FN stressed and hot hole stressed tunnel oxides Zous, NK; Wang, TH; Yeh, CC; Tsai, CW; Huang, CM
國立交通大學 2014-12-08T15:26:57Z Valence-band tunneling enhanced hot carrier degradation in ultra-thin oxide nMOSFETs Tsai, CW; Gu, SH; Chiang, LP; Wang, TH; Liu, YC; Huang, LS; Wang, MC; Hsia, LC
國立交通大學 2014-12-08T15:26:38Z Soft breakdown enhanced hysteresis effects in ultra-thin oxide SOI nMOSFETs Chen, MC; Tsai, CW; Gu, SH; Wang, TH
國立交通大學 2014-12-08T15:26:23Z Negative substrate bias enhanced breakdown hardness in ultra-thin oxide pMOSFETs Wang, TH; Tsai, CW; Chen, MC; Chan, CT; Chiang, HK; Lu, SH; Hu, HC; Chen, TF; Yang, CK; Lee, MT; Wu, DY; Chen, JK; Chien, SC; Sun, SW
國立交通大學 2014-12-08T15:26:17Z Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technology Lee, DY; Lin, HC; Chen, CL; Huang, TY; Wang, TH; Lee, TL; Chen, SC; Liang, MS
國立交通大學 2014-12-08T15:25:57Z Multi-level memory systems using error control codes Chang, HC; Lin, CC; Hsiao, TY; Wu, JT; Wang, TH

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