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"wang th"
Showing items 21-30 of 121 (13 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:44:15Z |
Interface induced uphill diffusion of boron: An effective approach for ultrashallow junction
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Wang, HCH; Wang, CC; Chang, CS; Wang, TH; Griffin, PB; Diaz, CH |
| 國立交通大學 |
2014-12-08T15:43:58Z |
On-chip ESD protection design by using polysilicon diodes in CMOS process
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Ker, MD; Chen, TY; Wang, TH; Wu, CY |
| 國立交通大學 |
2014-12-08T15:43:09Z |
Inequalities between Dirichlet and Neumann eigenvalues for domains in spheres
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Hsu, YJ; Wang, TH |
| 國立交通大學 |
2014-12-08T15:43:07Z |
A global pinching theorem for surfaces with constant mean curvature in S-3
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Hsu, YJ; Wang, TH |
| 國立交通大學 |
2014-12-08T15:42:55Z |
Arsenic/phosphorus LDD optimization by taking advantage of phosphorus transient enhanced diffusion for high voltage input/output CMOS devices
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Wang, HCH; Wang, CC; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH |
| 國立交通大學 |
2014-12-08T15:42:37Z |
Enhanced negative-bias-temperature instability of P-channel metal-oxide-semiconductor transistors due to plasma charging damage
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Lee, DY; Lin, HC; Wang, MF; Tsai, MY; Huang, TY; Wang, TH |
| 國立交通大學 |
2014-12-08T15:41:47Z |
Role of positive trapped charge in stress-induced leakage current for flash EEPROM devices
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Wang, TH; Zous, NK; Yeh, CC |
| 國立交通大學 |
2014-12-08T15:41:10Z |
A novel soft-program for a narrow erased state Vt distribution, read disturbance suppression and over-program annihilation in multilevel cell flash memories
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Yeh, CC; Fan, TH; Lu, TC; Wang, TH; Pan, S; Lu, CY |
| 國立交通大學 |
2014-12-08T15:41:07Z |
Auger recombination-enhanced hot carrier degradation in nMOSFETs with a forward substrate bias
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Tsai, CW; Chen, MC; Ku, SH; Wang, TH |
| 國立交通大學 |
2014-12-08T15:39:34Z |
Positive oxide charge-enhanced read disturb in a localized trapping storage flash memory cell
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Tsai, WJ; Yeh, CC; Zous, NK; Liu, CC; Cho, SK; Wang, TH; Pan, SC; Lu, CY |
Showing items 21-30 of 121 (13 Page(s) Totally)
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