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"wang th"的相關文件
顯示項目 46-70 / 118 (共5頁) << < 1 2 3 4 5 > >> 每頁顯示[10|25|50]項目
國立交通大學 |
2014-12-08T15:25:49Z |
Comparison of oxide breakdown progression in ultra-thin oxide SOI and bulk pMOSFETs
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Chan, CT; Kuo, CH; Tang, CJ; Chen, MC; Wang, TH; Lu, SH; Hu, HC; Chen, TF; Yang, CK; Lee, MT; Wu, DY; Chen, JK; Chien, SC; Sun, SW |
國立交通大學 |
2014-12-08T15:25:47Z |
Investigation of programmed charge lateral spread in a two-bit storage nitride flash memory cell by using a charge pumping technique
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Gu, SH; Wang, MT; Chan, CT; Zous, NK; Yeh, CC; Tsai, WJ; Lu, TC; Wang, TH; Ku, J; Lu, CY |
國立交通大學 |
2014-12-08T15:25:27Z |
Investigation of post-NBTI stress recovery in pMOSFETs by direct measurement of single oxide charge de-trapping
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Chan, CT; Ma, HC; Tang, CJ; Wang, TH |
國立交通大學 |
2014-12-08T15:19:37Z |
A novel fully CMOS process compatible PREM for SOC applications
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Yeh, CC; Wang, TH; Tsai, WJ; Lu, TC; Liao, YY; Zous, NK; Chin, CY; Chen, YR; Chen, MS; Ting, WC; Lu, CY |
國立交通大學 |
2014-12-08T15:19:29Z |
A novel PHINES flash memory cell with low power program/erase, small pitch, two-bits-per-cell for data storage applications
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Yeh, CC; Wang, TH; Tsai, WJ; Lu, TC; Chen, MS; Liao, YY; Ting, WC; Ku, YHJ; Lu, CY |
國立交通大學 |
2014-12-08T15:18:55Z |
Mechanism for slow switching effect in advanced low-voltage, high-speed Pb(Zr1-XTiX)O-3 ferroelectric memory
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Tsai, CW; Lai, SC; Yen, CT; Lien, HM; Lung, HL; Wu, TB; Wang, TH; Liu, R; Lu, CY |
國立交通大學 |
2014-12-08T15:18:45Z |
Substrate-bias-dependent dielectric breakdown in ultrathin-oxide p-metal-oxide-semiconductor field-effect transistors
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Chiang, S; Lu, MF; Huang-Lu, S; Chien, SC; Wang, TH |
國立交通大學 |
2014-12-08T15:18:29Z |
Excess low-frequency noise in ultrathin oxide n-MOSFETs arising from valence-band electron tunneling
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Wu, JW; You, JW; Ma, HC; Cheng, CC; Hsu, CF; Chang, CS; Huang, GW; Wang, TH |
國立交通大學 |
2014-12-08T15:17:56Z |
Electromigration lifetime improvement of copper interconnect by cap/dielectric interface treatment and geometrical design
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Lin, MH; Lin, YL; Chen, JM; Yeh, MS; Chang, KP; Su, KC; Wang, TH |
國立交通大學 |
2014-12-08T15:17:37Z |
Characterization of programmed charge lateral distribution in a two-bit storage nitride flash memory cell by using a charge-pumping technique
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Gu, SH; Wang, TH; Lu, WP; Ting, WC; Ku, YHJ; Lu, CY |
國立交通大學 |
2014-12-08T15:17:29Z |
Copper interconnect electromigration behavior in various structures and precise bimodal fitting
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Lin, MH; Lin, YL; Chang, KP; Sul, KC; Wang, TH |
國立交通大學 |
2014-12-08T15:17:01Z |
A novel operation method to avoid overerasure in a scaled trapping-nitride localized charge storage flash memory cell and its application for multilevel programming
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Tsai, WJ; Zous, NK; Wang, TH; Ku, YHJ; Lu, CY |
國立交通大學 |
2014-12-08T15:17:00Z |
Molecular epidemiology of long-term colonization of Candida albicans strains from HIV-infected patients
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Li, SY; Yang, YL; Chen, KW; Cheng, HH; Chiou, CS; Wang, TH; Lauderdale, TL; Hung, CC; Lo, HJ |
國立交通大學 |
2014-12-08T15:16:38Z |
A novel transient characterization technique to investigate trap properties in HfSiON gate dielectric MOSFETs - From single electron emission to PBTI recovery transient
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Wang, TH; Chan, CT; Tang, CJ; Tsai, CW; Wang, HCH; Chi, MH; Tang, DD |
國立交通大學 |
2014-12-08T15:05:43Z |
INVESTIGATIONS OF COMPLEX-MODES IN A GENERALIZED BILATERAL FINLINE WITH MOUNTING GROOVES AND FINITE CONDUCTOR THICKNESS
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WANG, WK; TZUANG, CK; CHANG, JS; WANG, TH |
國立交通大學 |
2014-12-08T15:05:32Z |
ANALYSIS OF THE DX TRAPS INDUCED TRANSIENT CHARACTERISTICS IN ALGAAS GAAS HEMTS
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WANG, TH; YU, CC |
國立交通大學 |
2014-12-08T15:05:30Z |
NUMERICAL-ANALYSIS OF NONEQUILIBRIUM ELECTRON-TRANSPORT IN ALGAAS/INGAAS/GAAS PSEUDOMORPHIC MODFETS
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WANG, TH; HSIEH, CH |
國立交通大學 |
2014-12-08T15:05:10Z |
MIXED-MODE SIMULATION OF DX TRAP-INDUCED SLOW TRANSIENT EFFECTS ON ALGAAS GAAS HEMT INVERTERS
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WANG, TH |
國立交通大學 |
2014-12-08T15:04:50Z |
POLY(DIMETHYL-CO-DIPHENYLSILANE) AS A DEEP-UV AND AN OXYGEN PLASMA PORTABLE CONFORMABLE MASK
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LOONG, WA; WANG, TH |
國立交通大學 |
2014-12-08T15:04:45Z |
QUANTUM-WELL GEOMETRICAL EFFECTS ON 2-DIMENSIONAL ELECTRON-MOBILITY
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WANG, TH; HSIEH, TH; CHEN, YT |
國立交通大學 |
2014-12-08T15:04:44Z |
MODELING HOT-ELECTRON GATE CURRENT IN SI MOSFETS USING A COUPLED DRIFT-DIFFUSION AND MONTE-CARLO METHOD
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HUANG, CM; WANG, TH; CHEN, CN; CHANG, MC; FU, J |
國立交通大學 |
2014-12-08T15:04:26Z |
QUANTUM CONFINEMENT EFFECTS ON LOW-DIMENSIONAL ELECTRON-MOBILITY
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WANG, TH; HSIEH, TH; CHEN, TW |
國立交通大學 |
2014-12-08T15:04:23Z |
CHARGE LOSS DUE TO AC PROGRAM DISTURBANCE STRESSES IN EPROMS
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LIN, JK; CHANG, CY; WANG, TH; HUANG, HS; CHEN, KL; HO, TS; KO, J |
國立交通大學 |
2014-12-08T15:04:18Z |
DEVICE AND CIRCUIT SIMULATION OF ANOMALOUS DX TRAP EFFECTS IN DCFL AND SCFL HEMT INVERTERS
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WANG, TH; WU, SJ; HUANG, CM |
國立交通大學 |
2014-12-08T15:03:47Z |
EFFECTS OF HOT-CARRIER-INDUCED INTERFACE STATE GENERATION IN SUBMICRON LDD MOSFETS
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WANG, TH; HUANG, CM; CHOU, PC; CHUNG, SSS; CHANG, TE |
顯示項目 46-70 / 118 (共5頁) << < 1 2 3 4 5 > >> 每頁顯示[10|25|50]項目
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