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Showing items 1-50 of 121 (3 Page(s) Totally)
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| 國家衛生研究院 |
2025-02-12 |
Time allocation to physical activity and sedentary behaviour and its iImpact on sarcopenia risk: A systematic review and meta-analysis
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Chien, SY;Wang, TH;Tzeng, YL;Lu, SH;Chang, TS |
| 國家衛生研究院 |
2025-02-10 |
FOXO3a/miR-4259-driven LDHA expression as a key mechanism of gemcitabine sensitivity in pancreatic ductal adenocarcinoma
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Hsu, TW;Wang, WY;Chen, HA;Wang, TH;Su, CM;Liao, PH;Chen, AL;Tsai, KY;Kokotos, G;Kuo, CC;Chiu, CF;Su, YH |
| 國家衛生研究院 |
2025-02-06 |
Association between early retirement and risk of frailty in later life: A population-based longitudinal study
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Wang, TH;Chien, SY;Cheng, WJ;Huang, YW;Wang, SH;Huang, WL;Tzeng, YL;Hsu, CC;Chen, WJ;Wu, CS |
| 國家衛生研究院 |
2025-01-24 |
Dose-response analysis of music intervention for improving delirium in intensive care unit patients: A systematic review and meta-analysis
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Dai, RS;Wang, TH;Chien, SY;Tzeng, YL |
| 國家衛生研究院 |
2024-11-22 |
The role of PM2.5 exposure in lung cancer: Mechanisms, genetic factors, and clinical implications
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Chen, CY;Huang, KY;Chen, CC;Chang, YH;Li, HJ;Wang, TH;Yang, PC |
| 國家衛生研究院 |
2024-05-20 |
Associations of early retirement and mortality risk: A population-based study in Taiwan
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Wang, TH;Chien, SY;Cheng, WJ;Huang, YW;Wang, SH;Huang, WL;Tzeng, YL;Hsu, CC;Wu, CS |
| 國家衛生研究院 |
2023-09-07 |
Controlled encapsulation of gold nanoparticles into Zr-metal-organic frameworks with improved detection limitation of volatile organic compounds via surface-enhanced raman scattering
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Lam, PK;Liao, JJ;Lin, MC;Li, YH;Wang, TH;Huang, HK;Hsu, YA;Hsieh, HYP;Kuan, PY;Chen, CT;Hao, GX;Tsung, CK;Wu, KCW;Šutka, A;Kinka, M;Chou, LY;Shieh, FK |
| 臺大學術典藏 |
2021-11-03T01:38:42Z |
Versatile Pt(II) Pyrazolate Complexes: Emission Tuning via Interplay of Chelate Designs and Stacking Assemblies
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Ko, CL; Hung, WY; Chen, PT; Wang, TH; Hsu, HF; Liao, JL; Ly, KT; Wang, SF; Yu, CH; Liu, SH; Lee, GH; Tai, WS; Chou, PT; Chi, Y; PI-TAI CHOU |
| 臺大學術典藏 |
2021-11-03T01:38:38Z |
Overcoming the energy gap law in near-infrared OLEDs by exciton-vibration decoupling
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Wei, YC; Wang, SF; Hu, Y; Liao, LS; Chen, DG; Chang, KH; Wang, CW; Liu, SH; Chan, WH; Liao, JL; Hung, WY; Wang, TH; Chen, PT; Hsu, HF; Chi, Y; Chou, PT; PI-TAI CHOU |
| 國家衛生研究院 |
2021-07-26 |
Cancer registry coding via hybrid neural symbolic systems in the cross-hospital setting
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Dai, HJ;Yang, YH;Wang, TH;Lin, YJ;Lu, PJ;Wu, CY;Chang, YC;Lee, YQ;Zhang, YC;Hsu, YC;Wu, HH;Ke, CR;Huang, CJ;Wang, YT;Yang, SF;Hsiao, KC;Liu, KJ;Chen, LT;Chang, IS;Chao, KSC;Liu, TW |
| 中山醫學大學 |
2020 |
Flavonoids Identification and Pancreatic Beta-Cell Protective Effect of Lotus Seedpod
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Lee, MS; Chyau, CC; Wang, CP; Wang, TH; Chen, JH; Lin, HH |
| 中山醫學大學 |
2020 |
Structural Validity of an ICF-Based Measure of Activity and Participation for Children in Taiwan's Disability Eligibility Determination System
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Hwang, AW; Yen, CF; Liao, HF; Chi, WC; Liou, TH; Chang, BS; Wu, TF; Kang, LJ; Lu, SJ; Simeonsson, RJ; Wang, TH; Bedell, G |
| 國立交通大學 |
2019-04-02T06:04:36Z |
CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS
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HUANG, CM; WANG, TH; CHEN, T; PENG, NC; CHANG, A; SHONE, FC |
| 臺大學術典藏 |
2018-09-10T06:47:20Z |
Effective prevention and treatment of Helicobacter pylori infection using a combination of catechins and sialic acid in AGS cells and BALB/c mice
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Yang, JC;Shun, CT;Chien, CT;Wang, TH.; Yang, J.-C. and Shun, C.-T. and Chien, C.-T. and Wang, T.-H.; Yang, JC; JYH-CHIN YANG; CHIA-TUNG SHUN; Shun, CT; Chien, CT; Wang, TH. |
| 國立交通大學 |
2018-08-21T05:53:38Z |
A global pinching theorem for surfaces with constant mean curvature in S-3
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Hsu, YJ; Wang, TH |
| 國立交通大學 |
2014-12-08T15:48:54Z |
Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique
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Wang, TH; Chang, TE; Chiang, LP; Wang, CH; Zous, NK; Huang, CM |
| 國立交通大學 |
2014-12-08T15:48:47Z |
Characterization of various stress-induced oxide traps in MOSFET's by using a subthreshold transient current technique
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Wang, TH; Chiang, LP; Zous, NK; Chang, TE; Huang, C |
| 國立交通大學 |
2014-12-08T15:46:18Z |
Transient effects of positive oxide charge on stress-induced leakage current in tunnel oxides
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Zous, NK; Wang, TH; Yeh, CC; Tsai, CW; Huang, CM |
| 國立交通大學 |
2014-12-08T15:46:14Z |
A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's
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Wang, TH; Chiang, LP; Zous, NK; Hsu, CF; Huang, LY; Chao, TS |
| 國立交通大學 |
2014-12-08T15:44:34Z |
Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology
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Wang, HCH; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH |
| 國立交通大學 |
2014-12-08T15:44:15Z |
Interface induced uphill diffusion of boron: An effective approach for ultrashallow junction
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Wang, HCH; Wang, CC; Chang, CS; Wang, TH; Griffin, PB; Diaz, CH |
| 國立交通大學 |
2014-12-08T15:43:58Z |
On-chip ESD protection design by using polysilicon diodes in CMOS process
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Ker, MD; Chen, TY; Wang, TH; Wu, CY |
| 國立交通大學 |
2014-12-08T15:43:09Z |
Inequalities between Dirichlet and Neumann eigenvalues for domains in spheres
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Hsu, YJ; Wang, TH |
| 國立交通大學 |
2014-12-08T15:43:07Z |
A global pinching theorem for surfaces with constant mean curvature in S-3
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Hsu, YJ; Wang, TH |
| 國立交通大學 |
2014-12-08T15:42:55Z |
Arsenic/phosphorus LDD optimization by taking advantage of phosphorus transient enhanced diffusion for high voltage input/output CMOS devices
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Wang, HCH; Wang, CC; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH |
| 國立交通大學 |
2014-12-08T15:42:37Z |
Enhanced negative-bias-temperature instability of P-channel metal-oxide-semiconductor transistors due to plasma charging damage
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Lee, DY; Lin, HC; Wang, MF; Tsai, MY; Huang, TY; Wang, TH |
| 國立交通大學 |
2014-12-08T15:41:47Z |
Role of positive trapped charge in stress-induced leakage current for flash EEPROM devices
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Wang, TH; Zous, NK; Yeh, CC |
| 國立交通大學 |
2014-12-08T15:41:10Z |
A novel soft-program for a narrow erased state Vt distribution, read disturbance suppression and over-program annihilation in multilevel cell flash memories
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Yeh, CC; Fan, TH; Lu, TC; Wang, TH; Pan, S; Lu, CY |
| 國立交通大學 |
2014-12-08T15:41:07Z |
Auger recombination-enhanced hot carrier degradation in nMOSFETs with a forward substrate bias
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Tsai, CW; Chen, MC; Ku, SH; Wang, TH |
| 國立交通大學 |
2014-12-08T15:39:34Z |
Positive oxide charge-enhanced read disturb in a localized trapping storage flash memory cell
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Tsai, WJ; Yeh, CC; Zous, NK; Liu, CC; Cho, SK; Wang, TH; Pan, SC; Lu, CY |
| 國立交通大學 |
2014-12-08T15:39:14Z |
An endurance evaluation method for flash EEPROM
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Zous, NK; Chen, YJ; Chin, CY; Tsai, WJ; Lu, TC; Chen, MS; Lu, WP; Wang, TH; Pan, SC; Lu, CY |
| 國立交通大學 |
2014-12-08T15:38:52Z |
Temperature effect on read current in a two-bit nitride-based trapping storage flash EEPROM cell
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Liu, MY; Chang, YW; Zous, NK; Yang, I; Lu, TC; Wang, TH; Ting, WC; Ku, J; Lu, CY |
| 國立交通大學 |
2014-12-08T15:38:44Z |
Pocket implantation effect on drain current flicker noise in analog nMOSFET devices
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Wu, JW; Cheng, CC; Chiu, KL; Guo, JC; Lien, WY; Chang, CS; Huang, GW; Wang, TH |
| 國立交通大學 |
2014-12-08T15:38:41Z |
Soft breakdown enhanced hysteresis effects in ultrathin oxide silicon-on-insulator metal-oxide-semiconductor field effect transistors
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Chen, MC; Ku, SH; Chan, CT; Wang, TH |
| 國立交通大學 |
2014-12-08T15:38:37Z |
A novel erase scheme to suppress overerasure in a scaled 2-bit nitride storage flash memory cell
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Yeh, CC; Wang, TH; Tsai, WJ; Lu, TC; Liao, YY; Chen, HY; Zous, NK; Ting, WC; Ku, J; Lu, CY |
| 國立交通大學 |
2014-12-08T15:38:37Z |
Lateral migration of trapped holes in a nitride storage flash memory cell and its qualification methodology
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Zous, NK; Lee, MY; Tsai, WJ; Kuo, A; Huang, LT; Lu, TC; Liu, CJ; Wang, TH; Lu, WP; Ting, WC; Ku, J; Lu, CY |
| 國立交通大學 |
2014-12-08T15:38:31Z |
Comparison of oxide breakdown progression in ultra-thin oxide silicon-on-insulator and bulk metal-oxide-semiconductor field effect transistors
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Chen, MC; Ku, SH; Chan, CT; Wang, TH |
| 國立交通大學 |
2014-12-08T15:27:51Z |
INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS
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WANG, TH; CHANG, TE; HUANG, CM |
| 國立交通大學 |
2014-12-08T15:27:37Z |
Field enhanced oxide charge detrapping in n-MOSFET's
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Wang, TH; Chang, TE; Chiang, LP; Huang, C |
| 國立交通大學 |
2014-12-08T15:27:37Z |
Mechanisms and characteristics of oxide charge detrapping in n-MOSFET's
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Wang, TH; Chang, TE; Chiang, LP; Huang, CM; Guo, JC |
| 國立交通大學 |
2014-12-08T15:27:30Z |
A new technique to measure an oxide trap density in a hot carrier stressed n-MOSFET
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Wang, TH; Chiang, LP; Chang, TE; Zous, NK; Shen, KY; Huang, C |
| 國立交通大學 |
2014-12-08T15:27:29Z |
Investigation of oxide charge trapping and detrapping in a n-MOSFET
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Wang, TH; Chang, TE; Chiang, LP; Zous, NK; Huang, C |
| 國立交通大學 |
2014-12-08T15:27:27Z |
Characterization of various stress-induced oxide traps in MOSFET's by using a novel transient current technique
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Wang, TH; Chiang, LP; Zous, NK; Chang, TE; Huang, C |
| 國立交通大學 |
2014-12-08T15:27:15Z |
Voltage scaling and temperature effects on drain leakage current degradation in a hot carrier stressed n-MOSFET
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Wang, TH; Hsu, CF; Chiang, LP; Zous, NK; Chao, TS; Chang, CY |
| 國立交通大學 |
2014-12-08T15:27:09Z |
A comparative study of SILC transient characteristics and mechanisms in FN stressed and hot hole stressed tunnel oxides
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Zous, NK; Wang, TH; Yeh, CC; Tsai, CW; Huang, CM |
| 國立交通大學 |
2014-12-08T15:26:57Z |
Valence-band tunneling enhanced hot carrier degradation in ultra-thin oxide nMOSFETs
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Tsai, CW; Gu, SH; Chiang, LP; Wang, TH; Liu, YC; Huang, LS; Wang, MC; Hsia, LC |
| 國立交通大學 |
2014-12-08T15:26:38Z |
Soft breakdown enhanced hysteresis effects in ultra-thin oxide SOI nMOSFETs
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Chen, MC; Tsai, CW; Gu, SH; Wang, TH |
| 國立交通大學 |
2014-12-08T15:26:23Z |
Negative substrate bias enhanced breakdown hardness in ultra-thin oxide pMOSFETs
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Wang, TH; Tsai, CW; Chen, MC; Chan, CT; Chiang, HK; Lu, SH; Hu, HC; Chen, TF; Yang, CK; Lee, MT; Wu, DY; Chen, JK; Chien, SC; Sun, SW |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technology
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Lee, DY; Lin, HC; Chen, CL; Huang, TY; Wang, TH; Lee, TL; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:25:57Z |
Multi-level memory systems using error control codes
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Chang, HC; Lin, CC; Hsiao, TY; Wu, JT; Wang, TH |
Showing items 1-50 of 121 (3 Page(s) Totally)
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