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Taiwan Academic Institutional Repository >
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"wang way seen"
Showing items 56-76 of 76 (4 Page(s) Totally)
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| 淡江大學 |
1991-11 |
Novel photonic device using nonlinear corner-bend structure
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張文清; Chang, Wen-ching; Liu, Shuh-fang; Wang, Way-seen |
| 國立臺灣大學 |
1990-08 |
Crosstalk and electromagnetic radiation measurements of some specific cables
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Chao, Fang-Lin; Wang, Way-Seen |
| 國立臺灣大學 |
1989 |
Reliable C-V Characterization of MOS Capacitors by Initial Treatment at the Presence of Slow Interface States
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胡振國; Lin, J. J.; 王維新; Hwu, Jenn-Gwo; Lin, J. J.; Wang, Way-Seen |
| 國立臺灣大學 |
1988 |
Residual Charges Effect on the Annealing Behavior of Co-60 Irradiated MOS Capacitors
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胡振國; Lee, G. S.; 李嗣涔; 王維新; 胡振國; Lee, G. S.; 李嗣涔; Wang, Way-Seen |
| 國立臺灣大學 |
1988 |
Characterization of reactively r.f.-sputtered tantalum oxide films
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Tu, Yuan-Kuang; Lin, Chia-Chien; Wang, Way-Seen; Huang, Sheng-Liang |
| 國立臺灣大學 |
1987 |
Charge Temperature Effects on Co-60 Irradiated Mos Capacitors
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Lee, G. S.; 胡振國; 李嗣涔; 王維新; Lee, G. S.; 胡振國; 李嗣涔; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Clockwise C-V Hysteresis Phenomena of Metal-Tantalum Oxide-Silicon-Oxide-Silicon(P) Capacitors Due to Leakage Current Through Tantalum Oxide
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胡振國; Jeng, M. J.; 王維新; Tu, Y. K.; Hwu, Jenn-Gwo; Jeng, M. J.; Wang, Way-Seen; Tu, Y. K. |
| 國立臺灣大學 |
1987 |
Interface Properties of Al/Ta205/Si02/Si (P) Capacitor
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胡振國; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Studies of the Radiation-Hardening CMOS Processes
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胡振國; 李嗣涔; 王維新; Hwu, Jenn-Gwo; Lee, Si-Chen; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Direct Indication of Interface Trap States in a MOS Capacitor from the Peaks of Optical Illumination-Induced Capacitances
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胡振國; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 臺大學術典藏 |
1987 |
Charge Temperature Effects on Co-60 Irradiated Mos Capacitors
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Lee, G. S.;胡振國;李嗣涔;王維新; Lee, G. S.;胡振國;李嗣涔;Wang, Way-Seen; Lee, G. S.; 胡振國; 李嗣涔; 王維新; 胡振國; 李嗣涔; Wang, Way-Seen |
| 臺大學術典藏 |
1987 |
Interface Properties of Al/Ta205/Si02/Si (P) Capacitor
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Hwu, Jenn-Gwo; Wang, Way-Seen; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 臺大學術典藏 |
1987 |
Studies of the Radiation-Hardening CMOS Processes
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Hwu, Jenn-Gwo; Lee, Si-Chen; Wang, Way-Seen; Hwu, Jenn-Gwo; Lee, Si-Chen; Wang, Way-Seen |
| 國立臺灣大學 |
1986 |
Direct Indication of Lateral Nonuniformities of MOS Capacitors from the Negative Equivalent Interface Trap Density Based on Charge-Temperature Technique
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胡振國; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 國立臺灣大學 |
1986 |
Relationship Between Mobile Charges and Interface Trap States in Silicon MOS Capacitors
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胡振國; 王維新; Chiou, Y. L.; Hwu, Jenn-Gwo; Wang, Way-Seen; Chiou, Y. L. |
| 國立臺灣大學 |
1986 |
The Effect of Postoxidation Cooling on Oxygen on the Interface Property of MOS Capacitors
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胡振國; Chang, J. J.; 王維新; Hwu, Jenn-Gwo; Chang, J. J.; Wang, Way-Seen |
| 國立臺灣大學 |
1986 |
Radiation Effects on the Oxide Properties of Silicon MOS Capacitor
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胡振國; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔; Hwu, Jenn-Gwo; Lee, G. S.; Jeng, M. J.; Wang, Way-Seen; Lee, Si-Chen |
| 國立臺灣大學 |
1985 |
The Effect of Charge-Temperature Aging on n-MOSFET
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胡振國; Lin, C. M.; 王維新; Hwu, Jenn-Gwo; Lin, C. M.; Wang, Way-Seen |
| 國立臺灣大學 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.; 林浩雄; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Wang, Way-Seen; Chiou, Y. L. |
| 國立臺灣大學 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.; 林浩雄; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Wang, Way-Seen; Chiou, Y. L. |
| 臺大學術典藏 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.;林浩雄;王維新;Chiou, Y. L.; Chang, C. Y.;林浩雄;王維新;Chiou, Y. L.; Chang, C. Y.;Lin, Hao-Hsiung;Wang, Way-Seen;Chiou, Y. L.; Chang, C. Y.; 林浩雄; 林浩雄; 王維新; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Lin, Hao-Hsiung; Wang, Way-Seen; Wang, Way-Seen; Chiou, Y. L.; Chiou, Y. L. |
Showing items 56-76 of 76 (4 Page(s) Totally)
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