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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立成功大學 |
2008-06-27 |
溫度對霰石穩定同位素與微量元素分佈的影響：無機沉澱實驗
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王文扞; Wang, Wen-Han |
| 國立成功大學 |
2003-04 |
Hot-carrier-induced degradation on 0.1 mu m partially depleted silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistor
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立成功大學 |
2002-12 |
Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Chen, Mao-Chieh; Yang, Fu-Liang |
| 國立成功大學 |
2002-07 |
Temperature dependence of hot-carrier-induced degradation in 0.1 mu m SOI nMOSFETs with thin oxide
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立成功大學 |
2002-06-27 |
熱載子效應在0 1μm短通道及2nm閘極薄氧化層SOI CMOSFET所造成特性退化之研究
|
王文翰; Wang, Wen-Han |
| 國立成功大學 |
2002-06-27 |
熱載子效應在0.1μm短通道及2nm閘極薄氧化層SOI CMOSFET所造成特性退化之研究
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王文翰; Wang, Wen-Han |
| 國立成功大學 |
2002-05-01 |
New observations on hot-carrier degradation in 0.1 mu m silicon-on-insulator n-type metal oxide semiconductor field effect transistors
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
Showing items 1-7 of 7 (1 Page(s) Totally)
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