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Showing items 41-50 of 126  (13 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:39:43Z Evaluation of advanced chemical mechanical planarization techniques for copper damascene interconnect Chen, KW; Wang, YL; Liu, CP; Yang, K; Chang, L; Lo, KY; Liu, CW
國立交通大學 2014-12-08T15:39:43Z Copper surface protection with a completely enclosed copper structure for a damascene process Wang, TC; Hsieh, TE; Wang, YL; Wu, YL; Lo, KY; Liu, CW; Chen, KW
國立交通大學 2014-12-08T15:39:43Z Study on precipitations of fluorine-doped silicon oxide Wu, J; Wang, YL; Liu, CP; Chang, SC; Kuo, CT; Ay, C
國立交通大學 2014-12-08T15:39:43Z Moisture resistance and thermal stability of fluorine-incorporation siloxane-based low-dielectric-constant material Cheng, YL; Wang, YL; Wu, YL; Liu, CP; Liu, CW; Lan, JK; O'Neil, ML; Ay, C; Feng, MS
國立交通大學 2014-12-08T15:39:43Z Monitor and eliminate the circular defects in HDP-STI deposition through oxynitride/oxide composite liner Lan, JK; Wang, YL; Liu, CP; Lee, WH; Ay, C; Cheng, YL; Chang, SC
國立交通大學 2014-12-08T15:39:16Z Effect of deposition temperature, on thermal stability in high-density plasma chemical vapor deposition fluorine-doped silicon dioxide Cheng, YL; Wang, YL; Chen, HW; Lan, JL; Liu, CP; Wu, SA; Wu, YL; Lo, KY; Feng, MS
國立交通大學 2014-12-08T15:38:56Z Optimization of post-N-2 treatment and undoped-Si-glass cap to improve metal wring delamination in deep submicron high-density plasma-fluorinated silica glass intermetal dielectric application Cheng, YL; Wang, YL; Lan, JK; Wu, SA; Chang, SC; Lo, KY; Feng, MS
國立交通大學 2014-12-08T15:38:39Z Direct COSi2 thin-film formation with homogeneous nanograin-size distribution by oxide-mediated silicidation Chang, JJ; Liu, CP; Chen, SW; Chang, CC; Hsieh, TE; Wang, YL
國立交通大學 2014-12-08T15:37:01Z Stress migration and electromigration improvement for copper dual damascene interconnection Wang, TC; Hsieh, TE; Wang, MT; Su, DS; Chang, CH; Wang, YL; Lee, JYM
國立交通大學 2014-12-08T15:35:42Z Modified polycrystalline silicon chemical-vapor deposition process for improving roughness at oxide/polycrystalline silicon interface Chang, JJ; Hsieh, TE; Wang, YL; Tseng, WT; Liu, CP; Lan, CY

Showing items 41-50 of 126  (13 Page(s) Totally)
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