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| 亞洲大學 |
2021-07-04 |
智慧應用與網站服務品質對持續網購意願之研究
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王于瑄; WANG, YU-XUAN |
| 國立交通大學 |
2020-10-05T02:02:01Z |
Interface Defect Shielding of Electron Trapping in a-InGaZnO Thin Film Transistors
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Lin, Chih-Chih; Tai, Mao-Chou; Chang, Ting-Chang; Tsao, Yu-Ching; Wang, Yu-Xuan; Tsai, Yu-Lin; Tu, Hong-Yi; Lu, I-Nien; Tsai, Tsung-Ming; Huang, Jen-Wei |
| 國立交通大學 |
2020-10-05T02:01:28Z |
A Novel Structural Design Serving as a Stress Relief Layer for Flexible LTPS TFTs
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Wang, Yu-Xuan; Chang, Ting-Chang; Huang, Shin-Ping; Tai, Mao-Chou; Zheng, Yu-Zhe; Wu, Chia-Chuan; Sze, Simon |
| 國立交通大學 |
2020-10-05T02:01:09Z |
Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
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Huang, Shin-Ping; Chen, Hong-Chih; Chen, Po-Hsun; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Chen, Yu-An; Sun, Pei-Jun; Huang, Hui-Chun; Lai, Wei-Chih; Chang, Ting-Chang |
| 國立交通大學 |
2020-09-30 |
Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistors
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Tu, Hong-Yi; Chang, Ting-Chang; Tsao, Yu-Ching; Tai, Mao-Chou; Tsai, Yu-Lin; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Lin, Chih-Chih; Kuo, Chuan-Wei; Tsai, Tsung-Ming; Wu, Chia-Chuan; Chien, Ya-Ting; Huang, Hui-Chun |
| 國立交通大學 |
2020-07-01T05:21:14Z |
Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTs
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Zheng, Yu-Zhe; Huang, Shin-Ping; Chen, Po-Hsun; Chang, Ting-Chang; Tsai, Tsung-Ming; Chu, Ann-Kuo; Hung, Yang-Hao; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Tu, Yu-Fa; Chen, Yu-An; Sun, Pei-Jun; Chung, Yu-Hua; Chen, Wei-Han; Wang, Tai-Jui |
| 國立交通大學 |
2020-07-01T05:21:14Z |
A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide
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Wang, Yu-Xuan; Chang, Ting-Chang; Huang, Shin-Ping; Tai, Mao-Chou; Zheng, Yu-Zhe; Wu, Chia-Chuan; Shih, Yu-Shan; Chen, Yu-An; Tsai, Yu-Lin; Tu, Hong-Yi; Lu, I-Nien; Zhou, Kuan-Ju; Lin, Chih-Chih; Chu, Ann-Kuo; Sze, Simon |
| 國立交通大學 |
2019-12-13T01:12:24Z |
Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
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Tu, Hong-Yi; Tsao, Yu-Ching; Tai, Mao-Chou; Chang, Ting-Chang; Tsai, Yu-Lin; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Chen, Hong-Chih; Tsai, Tsung-Ming; Wu, Chia-Chuan |
| 國立交通大學 |
2019-12-13T01:12:22Z |
Abnormal C-V Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs
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Huang, Shin-Ping; Chen, Po-Hsun; Tsao, Yu-Ching; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Shih, Yao-Kai; Chung, Yu-Hua; Chen, Wei-Han; Wang, Terry Tai-Jui; Zhang, Sheng-Dong; Chang, Ting-Chang |
| 國立交通大學 |
2019-12-13T01:09:53Z |
Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors
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Huang, Shin-Ping; Chen, Po-Hsun; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Tsao, Yu-Ching; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Lai, Wei-Chih; Chang, Ting-Chang |
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