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Institution	Date	Title	Author
國立臺灣大學	1990	Vacuum Lithography for 3-Dimensional Fabrication Using Finely Focused Ion Beams	王玉麟; Harriott, L. R.; Temkin, H.; Hamm, R. A.; Weiner, J. S.; Wang, Yuh-Lin; Harriott, L. R.; Temkin, H.; Hamm, R. A.; Weiner, J. S.
國立臺灣大學	1990	Vacuum Lithography for In-Situ Fabrication of Buried Semiconductor Microstructures	王玉麟; Temkin, H.; Harriott, L. R.; Weiner, J. S.; Hamm, R. A.; Wang, Yuh-Lin; Temkin, H.; Harriott, L. R.; Weiner, J. S.; Hamm, R. A.
國立臺灣大學	1989	Advanced Imaging and Analysis Techniques with a Scanning Ion Microprobe	王玉麟; Chabala, J. M.; Levi-Setti, R.; Wang, Yuh-Lin; Chabala, J. M.; Levi-Setti, R.
國立臺灣大學	1989	Advances in Processing High-Temperature Superconducting Thin Films with Lasers	王玉麟; Venkateasan, T.; Wu, X. D.; Inam, A.; Hegde, M. S.; Chase, E. W.; Chang, C. C.; England, P.; Hwang, D. M.; Krchnavek, R.; Wachtman, J. B.; McLean, W. L.; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Venkateasan, T.; Wu, X. D.; Inam, A.; Hegde, M. S.; Chase, E. W.; Chang, C. C.; England, P.; Hwang, D. M.; Krchnavek, R.; Wachtman, J. B.; McLean, W. L.; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1989	High Resolution SIMS Imaging of Multilayer Deposited High-Tc Thin Films	王玉麟; Levi-Setti, R.; Chabala, J. M.; Chang, R. P. R.; Hansley, D. L.; Ketterson, J. B.; Li, D. Q.; Wang, X. K.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Chang, R. P. R.; Hansley, D. L.; Ketterson, J. B.; Li, D. Q.; Wang, X. K.
國立臺灣大學	1989	Secondary Ion Imaging Microanalysis	王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.
國立臺灣大學	1989	The Use of Focused Heavy-Ion Beams for Submicrometer Imaging Microanalysis	王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.
國立臺灣大學	1989	Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution	王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學	1989	Ion Microprobe Analysis of Laser-Deposited Y-Ba-Cu Thin Film:Effects of Anneal Temperature	王玉麟; Levi-Setti, R.; Chabala, J. M.; Venkateasan, T.; Wu, X. D.; Inam, A.; Dutta, B.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Venkateasan, T.; Wu, X. D.; Inam, A.; Dutta, B.
國立臺灣大學	1989	Ion Microprobe Characterization of E-Beam Deposited Y-Ba-Cu(F)O Films:Effects of Post-Deposition Processing	王玉麟; Chabala, J. M.; Chang, R. P. R.; Ketterson, J. B.; Levi-Setti, R.; Li, D. X.; Wang, X. K.; Wang, Yuh-Lin; Chabala, J. M.; Chang, R. P. R.; Ketterson, J. B.; Levi-Setti, R.; Li, D. X.; Wang, X. K.
國立臺灣大學	1989	Microanalysis of Precipatitates in Aluminum-Lithium Alloys with a Scnning Ion Microscrope	王玉麟; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E.; Wang, Yuh-Lin; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E.
國立臺灣大學	1988	Angle Defined Secondary Ion Energy Spectra from Cesium-Modified Aluminum Surfaces	王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1988	Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution	王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學	1988	High Resolution Ion Probe Imaging and Analysis	王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學	1988	Scanning Ion Microscopy Images	王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1988	Effect of Weak Uniform Frustratation on the Resistive Transition in a Josephson Junction Array	王玉麟; Carini, P.; Nagel, S. R.; Levi-Setti, R.; Chabala, J. M.; Grow, G.; Wang, Yuh-Lin; Carini, P.; Nagel, S. R.; Levi-Setti, R.; Chabala, J. M.; Grow, G.
國立臺灣大學	1988	Micro-Secondary Ion Mass Spectroscopy:Physical and Instrumental Factors Affecting the Resolution	王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1988	Practical Resolution Limits of Imaging Microanalysis with a Scanning Ion Microscope	王玉麟; Chabala, J. M.; Levi-Setti, R.; Wang, Yuh-Lin; Chabala, J. M.; Levi-Setti, R.
國立臺灣大學	1988	Velocity and Work Function Dependence of Secondary Ion Emission	王玉麟; Wang, Yuh-Lin
國立臺灣大學	1987	Imaging SIMS at 20 nm Lateral Resolution:Exploratory Research Applications	王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin; Levi-Setti, R.; Crow, G.
國立臺灣大學	1987	Aspects of High Resolution Imaging with Scanning Ion Microprobe	王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1987	High Resolution Scanning Ion Microprobe Analysis of Retinal Tissue	王玉麟; Burns, M. S.; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Burns, M. S.; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1986	A Proposal for a High Resolution Scanning Ion Microprobe Based on Laser Non-Resonant Post-Ionization of Sputtered Atoms	王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1986	Analytical Applications of Focused Ion Beams	王玉麟; Parker, N. W.; Robinson, W. D.; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin; Parker, N. W.; Robinson, W. D.; Levi-Setti, R.; Crow, G.
國立臺灣大學	1986	High Resolution SIMS Imaging Microanalysis of Soft Biological Tissue	王玉麟; Levi-Setti, R.; Chabala, J. M.; Chandra, S.; Morrison G. H.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Chandra, S.; Morrison G. H.

Showing items 66-90 of 104 (5 Page(s) Totally)
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