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Showing items 76-85 of 104  (11 Page(s) Totally)
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Institution Date Title Author
國立臺灣大學 1989 Microanalysis of Precipatitates in Aluminum-Lithium Alloys with a Scnning Ion Microscrope 王玉麟; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E.; Wang, Yuh-Lin; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E.
國立臺灣大學 1988 Angle Defined Secondary Ion Energy Spectra from Cesium-Modified Aluminum Surfaces 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學 1988 Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學 1988 High Resolution Ion Probe Imaging and Analysis 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學 1988 Scanning Ion Microscopy Images 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學 1988 Effect of Weak Uniform Frustratation on the Resistive Transition in a Josephson Junction Array 王玉麟; Carini, P.; Nagel, S. R.; Levi-Setti, R.; Chabala, J. M.; Grow, G.; Wang, Yuh-Lin; Carini, P.; Nagel, S. R.; Levi-Setti, R.; Chabala, J. M.; Grow, G.
國立臺灣大學 1988 Micro-Secondary Ion Mass Spectroscopy:Physical and Instrumental Factors Affecting the Resolution 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學 1988 Practical Resolution Limits of Imaging Microanalysis with a Scanning Ion Microscope 王玉麟; Chabala, J. M.; Levi-Setti, R.; Wang, Yuh-Lin; Chabala, J. M.; Levi-Setti, R.
國立臺灣大學 1988 Velocity and Work Function Dependence of Secondary Ion Emission 王玉麟; Wang, Yuh-Lin
國立臺灣大學 1987 Imaging SIMS at 20 nm Lateral Resolution:Exploratory Research Applications 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin; Levi-Setti, R.; Crow, G.

Showing items 76-85 of 104  (11 Page(s) Totally)
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