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Showing items 56-80 of 104 (5 Page(s) Totally)
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Institution	Date	Title	Author
國立臺灣大學	1991	Nanometer Scale Focused Ion Beam Vacuum Lithography Using an Ultrathin Native Oxide Resist	王玉麟; Harriott, L. R.; Temkin, H.; Chu, C. H.; Hseih, Y. F.; Hamm, R. A.; Panish, M. B.; Wade, H. H.; Wang, Yuh-Lin; Harriott, L. R.; Temkin, H.; Chu, C. H.; Hseih, Y. F.; Hamm, R. A.; Panish, M. B.; Wade, H. H.
國立臺灣大學	1991	Optical and Electrical Properties of InP/InGaAs Grown Selectively on Silicon dioxide-Masked InP	王玉麟; Feygenson, A.; Hamm, R. H.; Ritter, D.; Weiner, J. S.; Temkin, H.; Panish, M. B.; Wang, Yuh-Lin; Feygenson, A.; Hamm, R. H.; Ritter, D.; Weiner, J. S.; Temkin, H.; Panish, M. B.
國立臺灣大學	1991	Semiconductor Lasers Fabricated by Selective Area Epitaxy	王玉麟; Temkin, H.; Hamm, R. A.; Yadvish, R. D.; Ritter, D.; Harriott, L. H.; Panish, M. B.; Wang, Yuh-Lin; Temkin, H.; Hamm, R. A.; Yadvish, R. D.; Ritter, D.; Harriott, L. H.; Panish, M. B.
國立臺灣大學	1990	Buried Heterostructure Laser Fabricated by in-Situ Processing Techniques	王玉麟; Temkin, H.; Harriott, L. R.; Logan, R. A.; Tanbun-Ek, T.; Wang, Yuh-Lin; Temkin, H.; Harriott, L. R.; Logan, R. A.; Tanbun-Ek, T.
國立臺灣大學	1990	Deep Structures Produced in III-V Materials by Combined Focused Ion Beam Irradiation and Dry Etching	王玉麟; Harriott, L. R.; Chin, B. H.; Temkin, H.; Wang, Yuh-Lin; Harriott, L. R.; Chin, B. H.; Temkin, H.
國立臺灣大學	1990	Dendritic Oxide Growth on the Surface of Liquid Gallium	王玉麟; Raval, A.; Levi-Setti, R.; Wang, Yuh-Lin; Raval, A.; Levi-Setti, R.
國立臺灣大學	1990	In-Situ Patterning and Regrowth of InP Based Heterostructures Using a Native Oxide Mask	王玉麟; Harriott, L. R.; Temkin, H.; Wang, Yuh-Lin; Harriott, L. R.; Temkin, H.
國立臺灣大學	1990	On the Optimization of Ion Microprobes	王玉麟; Shao, Z.; Wang, Yuh-Lin; Shao, Z.
國立臺灣大學	1990	Optical Properties of InGaAs/InP Semiconductor Nanostructures	王玉麟; Weiner, J. S.; Temkin, H.; Hamm, R. A.; Panish, M. B.; Harriott, L. R.; Wang, Yuh-Lin; Weiner, J. S.; Temkin, H.; Hamm, R. A.; Panish, M. B.; Harriott, L. R.
國立臺灣大學	1990	Role of Native Oxide Layers in the Patterning of InP Using Focused Ion Beam and Ion Assisted Cl2 Etching	王玉麟; Harriott, L. R.; Hamm, R. A.; Temkin, H.; Wang, Yuh-Lin; Harriott, L. R.; Hamm, R. A.; Temkin, H.
國立臺灣大學	1990	Vacuum Lithography for 3-Dimensional Fabrication Using Finely Focused Ion Beams	王玉麟; Harriott, L. R.; Temkin, H.; Hamm, R. A.; Weiner, J. S.; Wang, Yuh-Lin; Harriott, L. R.; Temkin, H.; Hamm, R. A.; Weiner, J. S.
國立臺灣大學	1990	Vacuum Lithography for In-Situ Fabrication of Buried Semiconductor Microstructures	王玉麟; Temkin, H.; Harriott, L. R.; Weiner, J. S.; Hamm, R. A.; Wang, Yuh-Lin; Temkin, H.; Harriott, L. R.; Weiner, J. S.; Hamm, R. A.
國立臺灣大學	1989	Advanced Imaging and Analysis Techniques with a Scanning Ion Microprobe	王玉麟; Chabala, J. M.; Levi-Setti, R.; Wang, Yuh-Lin; Chabala, J. M.; Levi-Setti, R.
國立臺灣大學	1989	Advances in Processing High-Temperature Superconducting Thin Films with Lasers	王玉麟; Venkateasan, T.; Wu, X. D.; Inam, A.; Hegde, M. S.; Chase, E. W.; Chang, C. C.; England, P.; Hwang, D. M.; Krchnavek, R.; Wachtman, J. B.; McLean, W. L.; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Venkateasan, T.; Wu, X. D.; Inam, A.; Hegde, M. S.; Chase, E. W.; Chang, C. C.; England, P.; Hwang, D. M.; Krchnavek, R.; Wachtman, J. B.; McLean, W. L.; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1989	High Resolution SIMS Imaging of Multilayer Deposited High-Tc Thin Films	王玉麟; Levi-Setti, R.; Chabala, J. M.; Chang, R. P. R.; Hansley, D. L.; Ketterson, J. B.; Li, D. Q.; Wang, X. K.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Chang, R. P. R.; Hansley, D. L.; Ketterson, J. B.; Li, D. Q.; Wang, X. K.
國立臺灣大學	1989	Secondary Ion Imaging Microanalysis	王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.
國立臺灣大學	1989	The Use of Focused Heavy-Ion Beams for Submicrometer Imaging Microanalysis	王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.
國立臺灣大學	1989	Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution	王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學	1989	Ion Microprobe Analysis of Laser-Deposited Y-Ba-Cu Thin Film:Effects of Anneal Temperature	王玉麟; Levi-Setti, R.; Chabala, J. M.; Venkateasan, T.; Wu, X. D.; Inam, A.; Dutta, B.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Venkateasan, T.; Wu, X. D.; Inam, A.; Dutta, B.
國立臺灣大學	1989	Ion Microprobe Characterization of E-Beam Deposited Y-Ba-Cu(F)O Films:Effects of Post-Deposition Processing	王玉麟; Chabala, J. M.; Chang, R. P. R.; Ketterson, J. B.; Levi-Setti, R.; Li, D. X.; Wang, X. K.; Wang, Yuh-Lin; Chabala, J. M.; Chang, R. P. R.; Ketterson, J. B.; Levi-Setti, R.; Li, D. X.; Wang, X. K.
國立臺灣大學	1989	Microanalysis of Precipatitates in Aluminum-Lithium Alloys with a Scnning Ion Microscrope	王玉麟; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E.; Wang, Yuh-Lin; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E.
國立臺灣大學	1988	Angle Defined Secondary Ion Energy Spectra from Cesium-Modified Aluminum Surfaces	王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.
國立臺灣大學	1988	Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution	王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學	1988	High Resolution Ion Probe Imaging and Analysis	王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.
國立臺灣大學	1988	Scanning Ion Microscopy Images	王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.

Showing items 56-80 of 104 (5 Page(s) Totally)
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